1. Microstructure of RE2O3 layers on cube textured Ni substrates
- Author
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Hoydoo You, Victor A. Maroni, Cornelis Leo Hans Thieme, Marty Rupich, Rachel E. Koritala, Jung Ho Je, W.G. Cullen, and Beihai Ma
- Subjects
Materials science ,Rare-earth element ,Energy Engineering and Power Technology ,chemistry.chemical_element ,Condensed Matter Physics ,Microstructure ,Epitaxy ,Electronic, Optical and Magnetic Materials ,Lattice mismatch ,Nickel ,Crystallography ,chemistry ,Transition metal ,Lattice (order) ,Electrical and Electronic Engineering - Abstract
We investigated the structure and alignment of epitaxial Y2O3 and Gd2O3 films on cube textured Ni(0 0 1) substrates and used the findings to develop a general interpretation of the morphology of RE2O3 films (RE=Y or a rare earth element) on cube textured nickel and nickel-based alloys. The [1 0 0] axis of RE2O3 oxides mostly prefers aligning to the Ni[1 1 0] axis, while the [0 0 1] axis is aligned with the Ni[0 0 1] axis. This (2 2 ×2 2 )R45° extended domain matching (EDM) seems to be favored by a high coincidence site density (CSD) with the Ni(0 0 1) surface atoms, in spite of the existence of large lattice mismatches to Ni(0 0 1). Meanwhile a 3×3 EDM is not favored on Ni(0 0 1), in spite of the relatively small lattice mismatch to Ni(0 0 1), because of the existence of a low CSD. The broad mosaic distributions of RE2O3(0 0 l) grains (6–9° full-width at half-maximum) indicate that RE2O3 layers prefer growing along the Ni(0 0 1) planes rather than along the Ni surface, a condition presumably induced by the favorable energetics for EDM.
- Published
- 2003
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