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41 results on '"Vorburger, T.V."'

1. List of Contributors

Author

Lilien, R., primary, Nichols, Ronald, additional, Petraco, N., additional, Song, J., additional, and Vorburger, T.V., additional

Published
2019
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5. The second National Ballistics Imaging Comparison (NBIC-2)

Author

Vorburger, T.V., Yen, J., Song, J.F., Thompson, R.M., Renegar, T.B., Zheng, A., and Tong, M.

Subjects
United States. Bureau of Alcohol, Tobacco, Firearms and Explosives. National Integrated Ballistic Information Network, Forensic ballistics -- Standards, Chemistry, Physics, Science and technology
Abstract

1. Introduction In the late 1990s, the National Integrated Ballistics Information Network (NIBIN), initially called the Ceasefire Program, was established in the United States [1,2]. The NIBIN consists of about [...]

Published
2014
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7. Stylus flight in surface profiling

Author

Fong, J.F. and Vorburger, T.V.

Subjects
Surface roughness -- Measurement, Scientific equipment and supplies -- Models, Engineering and manufacturing industries, Science and technology
Abstract

In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts stylus flight from the traversing speed, stylus force, stylus radius and parameters of the surface.

Published
1996

8. Autocorrelation functions from optical scattering for one-dimensionally rough surfaces

Author

Marx, Egon, Leridon, Brigitte, Lettieri, T.R., Song, J.-F., and Vorburger, T.V.

Subjects
Light scattering -- Analysis, Surface roughness -- Analysis, Autocorrelation (Statistics) -- Analysis, Astronomy, Physics
Abstract

The relationship between the height autocorrelation function of a one-dimensionally rough surface and the Fourier transform of the intensity distribution of the light scattered by that surface is tested experimentally. The theory is derived by using the Fraunhofer approximation, without recourse to the inconsistent Kirchhoff boundary conditions. In spite of the limitations imposed by the approximations used, the results obtained from optical data agree well with those obtained from stylus data, even for an autocorrelation length as small as the optical wavelength. However, this method should be limited to surfaces with rms roughness smaller than approximately 0.14 times the wavelength of light.

Published
1993

14. Problems in surface metrology

Author

Vorburger, T.V., primary, Dixson, R.G., additional, Tsai, V., additional, Doi, T., additional, Song, J.F., additional, Renegar, T.B., additional, and Fu, J., additional

Published
1998
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25. Evidence for the distortion of C2H4and C2H2chemisorbed on W(100)

Author

Vorburger, T.V., Waclawski, B.J., and Plummer, E.W.

Abstract

The adsorption of C2H4on W(100) has been studied by ultraviolet photoelectron spectroscopy with hν = 21.22 eV. The spectrum measured after in initial saturation exposure at 80 K exhibits structure which correlates well with energy levels recently calculated by Demuth and Eastman (DE) for sp3rehybridized C2H4. Dehydrogenation of the adsorbate, either by subsequent heating to 295 K or direct adsorption at 295 K, yields a spectrum which correlates with DE's calculation for sp2rehybridized C2H2. These results suggest that C2H4and C2H2may be distorted from their planar and linear structures respectively and that the C-C bonds on these molecules are stretched by adsorption on W(100). Qualitative arguments suggest that the bonding site for both melecules is directly over a W atom and that the Dewar—Chatt model for π-d bonding in organometallic compounds is applicable.

Published
1977
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26. Industrial Uses of STM and AFM**Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.

Author

Vorburger, T.V., Dagata, J.A., Wilkening, G., Lizuka, K., Thwaite, E.G., and Lonardo, P.

Abstract

We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to industry, research performed by industry, applications off-line in manufacturing, and applications on-line in manufacturing. We also discuss the role of metrology for certain applications and briefly review many other types of SPMs besides STM and AFM. We conclude by emphasizing ultra-precision positioning, nanofabrication, and biomedical applications as important future directions in the field.

Published
1997
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27. Calibration of Road Roughness Measuring Equipment, Volume II: Calibration Procedures

Author

United States. Federal Highway Administration. Office of Engineering and Highway Operations R&D, Hegmon, Rudolph R., Vorburger, T.V., Robinson, D.C., Fick, S.E., Flynn, D.R., National Institute of Standards and Technology (U.S.), United States. Federal Highway Administration. Office of Engineering and Highway Operations R&D, Hegmon, Rudolph R., Vorburger, T.V., Robinson, D.C., Fick, S.E., Flynn, D.R., and National Institute of Standards and Technology (U.S.)

Abstract

DTFH61-85-Y-10004, A separate report, FHWA-RD-89-077, Calibration of Road Roughness Measuring Equipment, Volume I: Experimental Investigation, documents an extensive series of measurements of the performance of a commercial inertial road profiling system (IRPS) and a commercial response-type road roughness measurement (RTRRM) system. Based upon the results of these measurements and upon an analysis of the operation of such equipment, calibration and testing guides, given in the present report, were developed to assist users in assessment of IRPS and RTRRM functionality and operating performance.

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