225 results on '"Vizkelethy, G."'
Search Results
2. Determination of radiation hardness of silicon diodes
3. Carrier capture and emission by substitutional carbon impurities in GaN vertical diodes.
4. Transient Photocurrent From High-Voltage Vertical GaN Diodes Irradiated With Electrons: Experiments and Simulations
5. Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical, high voltage GaN diodes
6. Modeling charge collection efficiency degradation in partially depleted GaAs photodiodes using the 1- and 2-carrier Hecht equations
7. Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment
8. Test simulation of neutron damage to electronic components using accelerator facilities
9. Investigation of ion beam induced radiation damage in Si PN diodes
10. The new Sandia light ion microbeam
11. Proton irradiation effects on minority carrier diffusion length and defect introduction in homoepitaxial and heteroepitaxial n-GaN.
12. Development of a radiation-hardened lateral power MOSFET for POL applications
13. Charge generation by secondary particles from nuclear reactions in BEOL materials
14. Comparison between experimental and simulation results for ion beam and neutron irradiations in silicon bipolar junction transistors
15. Metrics for comparison between displacement damage due to ion beam and neutron irradiation in silicon BJTs
16. The theory of ion beam induced charge in metal-oxide-semiconductor structures
17. A review of ion beam induced charge microscopy
18. Ion beam induced charge (IBIC) studies of silicon germanium heterojunction bipolar transistors (HBTs)
19. Damage equivalence of heavy ions in silicon bipolar junction transistors
20. Statistical analysis of the charge collected in SOI and bulk devices under heavy 1on and proton irradiation--implications for digital SETs
21. Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices
22. Charge enhancement effect in NMOS bulk transistors induced by heavy ion irradiation--comparison with SOI
23. Charge collection by capacitive influence through isolation oxides
24. Charge collection in SOI capacitors and circuits and its effect on SEU hardness
25. Radiation effects microscopy for failure analysis of microelectronic devices
26. Heavy Ion Microbeam- and Broadbeam-Induced Current Transients in SiGe HBTs
27. High-Speed Single-Event Current Transient Measurements in SiGe HBTs
28. Ion beam induced luminescence of doped yttrium compounds
29. Ion-induced emission microscopies
30. Ion photon emission microscopy
31. Anomalous charge collection from silicon-on-insulator structures
32. Logic upsets in SRAMs using ion electron emission microscopy
33. Training a Neural Network on Analog TaOx ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim
34. Defect annealing in neutron and ion damaged silicon: Influence of defect clusters and doping.
35. Imaging the Impact of Proton Irradiation on Edge Terminations in Vertical GaN PIN Diodes
36. Comparison of Gain Degradation and Deep Level Transient Spectroscopy in pnp Si Bipolar Junction Transistors Irradiated With Different Ion Species
37. Oxidation and reduction of copper oxide thin films.
38. Fabrication and characterization of a co-planar detector in diamond for low energy single ion implantation
39. Performance and Breakdown Characteristics of Irradiated Vertical Power GaN P-i-N Diodes
40. Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam
41. Ion Beam Induced Luminescence of Doped Yttrium Compunds
42. Radiation-induced resistance changes in TaOx and TiO2 memristors
43. Total ionizing dose and displacement damage effects on TaOx memristive memories
44. Experimental Study of Defect Formations in GaAs Devices Using Gain, Photoluminescence and Deep Level Transient Spectroscopy
45. Initial Assessment of the Effects of Radiation on the Electrical Characteristics of ${\rm TaO}_{\rm x}$ Memristive Memories
46. Single-Event Transient Sensitivity of InAlSb/InAs/AlGaSb High Electron Mobility Transistors
47. Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs
48. Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs
49. Ion beam characterization of advanced luminescent materials for application in radiation effects microscopy
50. The Feasibility and Development of an In situ Ion Irradiation TEM at Sandia National Laboratories
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.