1. YBa2Cu3O7-xfilms prepared by TFA-MOD method for coated conductor application
- Author
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Alessandro Rufoloni, Umberto Gambardella, Andrea Augieri, Vincenzo Boffa, Angelo Vannozzi, Lelia Ciontea, Antonella Mancini, Traian Petrisor, Valentina Galluzzi, and G. Celentano
- Subjects
Diffraction ,History ,Materials science ,Scanning electron microscope ,Analytical chemistry ,Substrate (electronics) ,Epitaxy ,Computer Science Applications ,Education ,Full width at half maximum ,Crystallography ,chemistry.chemical_compound ,chemistry ,Trifluoroacetic acid ,Deposition (law) ,Yttria-stabilized zirconia - Abstract
The epitaxial growth of YBCO films both on (001) SrTiO3 (STO) and Ni-W biaxially textured metallic substrates prepared by metal-organic deposition (MOD) using a trifluoroacetic acid (TFA) solution is reported. The degree of epitaxy of the YBCO films was investigated by X-ray diffraction and scanning electron microscopy (SEM). The as deposited films exhibit good morphological and structural properties. The ω-scan of the YBCO films grown on (001) SrTiO3 single crystal substrate and on Pd/CeO2/YSZ/CeO2 buffered biaxially textured Ni-5at%W (Ni-W) tapes has a full width at half maximum (FWHM) of 0.12° and 3.4°, respectively. The -scan of (113) peak of YBCO film grown on Ni-W substrate has FWHM of 6.1°. The YBCO/STO film has a zero resistance critical temperature of Tc(R = 0) = 92 K and a critical current density Jc > 2 MA/cm2 at 77 K and in zero magnetic field.
- Published
- 2006
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