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1. Integrated planning of maintenance operations and workload allocation.

3. A study of variability induced by events dependency in microelectronic production

11. A sampling-based approach for managing lot release in time constraint tunnels in semiconductor manufacturing.

14. Observer-based detection of time shift failures in (max,+)-linear systems

21. GENERIC DATA MODEL FOR SEMICONDUCTOR MANUFACTURING SUPPLY CHAINS

22. Analyzing different dispatching policies for probability estimation in time constraint tunnels in semiconductor manufacturing

26. Quality and exposure control in semiconductor manufacturing. Part II: Evaluation.

27. Quality and exposure control in semiconductor manufacturing. Part I: Modelling.

28. A literature review on variability in semiconductor manufacturing: The next forward leap to Industry 4.0

29. Ideal and potential flexibility measures for qualification management in semiconductor manufacturing

33. Modeling complex processability constraints in high-mix semiconductor manufacturing

34. Optimisation des contrôles dans la fabrication des semiconducteurs

35. INDUSTRIAL IMPLEMENTATION OF A DYNAMIC SAMPLING ALGORITHM IN SEMICONDUCTOR MANUFACTURING: APPROACH AND CHALLENGES

36. Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling

37. A Mathematical Programming Approach for Determining Control Plans in Semiconductor Manufacturing

38. A SMART SAMPLING SCHEDULING AND SKIPPING SIMULATOR AND ITS EVALUATION ON REAL DATA SETS

39. Impact of Sampling on W@R and Metrology Time delay

40. Optimizing Return On Inspection Trough Defectivity Smart Sampling

41. Computation of Wafer-At-Risk from Theory to Real Life Demonstration

42. A Novel Approach to Minimize the number of Controls in Defectivity Area (13th Technical Meeting of ARCSIS, Rousset 2010)

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