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III-Sb barrier detectors suitable for the mid-wave infrared were grown on GaSb by molecular beam epitaxy. Using both bulk-InAsSb and an InAsSb–InAs strained layer superlattice, operation close to room temperature was demonstrated with cutoff wavelengths of 4.82 and 5.79 μm, respectively, with zero-bias operation possible for the bulk-InAsSb detector. X-ray diffraction, temperature dependent dark current, and spectral quantum efficiency were measured, and an analysis based on calculated specific detectivity was carried out. 1/f noise effects are considered. Results indicate that these optimized devices may be suitable as alternatives to InSb, or even HgCdTe, for many applications, especially where available power is limited.

GaSb-based materials can be used to produce high performance photonic devices operating in the technologically important mid-infrared spectral range. Direct epitaxial growth of GaSb on silicon (Si) is an attractive method to reduce manufacturing costs and opens the possibility of new applications, such as lab-on-a-chip MIR photonic integrated circuits and monolithic integration of focal plane arrays (FPAs) with Si readout integrated circuits (ROICs). However, fundamental material dissimilarities, such as the large lattice mismatch, polar-nonpolar character of the III-V/Si interface and differences in thermal expansion coefficients lead to the formation of threading dislocations and antiphase domains, which effect the device performance. This work reports on the molecular beam epitaxial growth of high quality GaSb-based materials and devices onto Si. This was achieved using a novel growth procedure consisting of an efficient AlSb interfacial misfit array, a two-step GaSb growth temperature procedure and a series of dislocation filter superlattices, resulting in a low defect density, anti-phase domain free GaSb buffer layer on Si. A nBn barrier photodetector based on a type-II InAs/InAsSb superlattice was grown on top of the buffer layer. The device exhibited an extended 50 % cut-off wavelength at 5.40 μm at 200 K which moved to 5.9 μm at 300 K. A specific detectivity of 1.5 x1010 Jones was measured, corresponding in an external quantum efficiency of 25.6 % at 200 K.

Resonant cavity-enhanced photodetectors (RCE PDs) present a compelling alternative to broadband detection techniques in the field of gas detection and environmental sensing, due to the distinctive narrow-band absorption fingerprints of gases such as N2O (at 4.5 μm) or CO (4.6 μm). This characteristic aligns well with the operational mode of an RCE PD, whose VCSEL-like architecture results in a tuneable narrow-band spectral response with a significantly enhanced quantum efficiency. Additionally, unlike broadband detectors, RCE PDs are not subject to the broadband BLIP limit due to their high spectral selectivity, while the substantially reduced absorber volume offers commensurately reduced Auger and generation-recombination dark current densities. In this work, we present efforts to extend the operability of these structures beyond 4.0 μm wavelength by employing the type-II InAs/InAsSb superlattice as the absorber material. The tuneable bandgap of this structure allows to achieve and demonstrate a MWIR RCE PD with a highly thermally stable resonant response at ~ 4.45 μm, a Q factor of 85-95, full-width-at-half-maximum of ~ 50 nm and a peak quantum efficiency of 84% at 240 K - features which are promising for detection of gases such as CO and N2O. The broadband BLIP is also achieved at 180 K, a result which could potentially enable thermoelectrically cooled operation in the future. Finally, thanks to the inherent bandgap tunability of the InAs/InAsSb superlattice, extension of resonant response into the LWIR range is achievable with relatively straightforward changes to the already existing RCE PD structure.

Mid-infrared (MIR) silicon photonics holds the potential for realizing next generation ultracompact spectroscopic systems for applications in gas sensing, defense, and medical diagnostics. The direct epitaxial growth of antimonide-based compound semiconductors on silicon provides a promising approach for extending the wavelength of silicon photonics to the longer infrared range. This paper reports on the fabrication of a high performance MIR photodetector directly grown onto silicon by molecular beam epitaxy. The device exhibited an extended cutoff wavelength at ∼5.5 μm and a dark current density of 1.4 × 10–2 A/cm2 under 100 mV reverse bias at 200 K. A responsivity of 0.88 A/W and a specific detectivity in the order of 1.5 × 1010 Jones was measured at 200 K under 100 mV reverse bias operation. These results were achieved through the development of an innovative structure which incorporates a type-II InAs/InAsSb superlattice-based barrier nBn photodetector grown on a GaSb-on-silicon buffer layer. The difficulties in growing GaSb directly on silicon were overcome using a novel growth procedure consisting of an efficient AlSb interfacial misfit array, a two-step growth temperature procedure and dislocation filters resulting in a low defect density, antiphase domain free GaSb epitaxial layer on silicon. This work demonstrates that complex superlattice-based MIR photodetectors can be directly integrated onto a Si platform, which provides a pathway toward the realization of new, high performance, large area focal plane arrays and mid-infrared integrated photonic circuits.

The design, fabrication, and characterization of a resonant cavity-enhanced photodetector (RCE PD) operating in the long-wavelength infrared regime are demonstrated. The incorporation of the low bandgap InAs/ InAs 0.70 Sb 0.30 type-II strained-layer superlattice into the absorber layer of the detector cavity, along with the high-reflectivity (Rm > 0.9) AlAs 0.08 Sb 0.92/GaSb distributed Bragg reflector pairs, results in resonant enhancement at 7.7–7.8 μm, which is a spectral region relevant in applications in sensing of chemical warfare agents and in medical biomarker diagnostics. These resonant wavelength peaks also display a high quality factor in the range of 76–86 and a small temperature coefficient of 0.52 nm K−1. An nBn architecture, where an Al 0.71 Ga 0.29 As 0.08 Sb 0.92 layer acts as a barrier for majority electrons while minimizing the valence band offset with the absorber, is also incorporated into the cavity in order to improve the electrical properties of the detector. Spectral response measurements yield a peak external quantum efficiency of 14.6% and a peak responsivity of 0.91 A W−1 at 77 K and −0.8 V; meanwhile, a dark current density of 2.0 × 10−4 A cm−2 at 77 K results in a specific detectivity of 3.7 × 1010 cm Hz 1 / 2 W−1, coming close to the theoretical background-limited D * of an ideal broadband photovoltaic detector with the superlattice composition as that of the RCE PD.

InAs/InAs1-xSbx type-II strained-layer superlattices (SLS) are a structure with potential infrared detection applications, owing to its tunable bandgap and suppressed Auger recombination. A series of medium-wavelength infrared (MWIR) InAs/InAs0.815Sb0.185 SLS structures, grown as undoped absorption epilayers on GaAs, were fabricated using molecular beam epitaxy in order to study the dependence of the ground state transitions on temperature and superlattice period thickness. Photoluminescence peaks at 4 K were obtained with the use of a helium-cooled micro-PL system and an InSb detector, and temperature-dependent absorption spectra were measured in the range 77 K – 300 K on a Fourier Transform Infrared (FTIR) spectrometer, equipped with a 1370 K blackbody source and a DTGS detector. An nBn device sample with the absorber structure identical to one of the undoped samples was also grown and processed with the goal of measuring temperature-dependent spectral response. A model for superlattice band alignment was also devised, incorporating the Bir-Pikus transformation results for uniaxial and biaxial strain, and the Einstein oscillator model for bandgap temperature dependence. Absorption coefficients of several 1000 cm-1 throughout the entire MWIR range are found for all samples, and temperature dependence of the bandgaps is extracted and compared to the model. This and photoluminescence data also demonstrate bandgap shifts consistent with the different superlattice periods of the three samples.

Mid-infrared resonant cavity-enhanced photodetectors (RCE PD) present a promising technology for targeted gas detection. We demonstrate an RCE PD incorporating an InAs/InAsSb superlattice as the detecting element, extending the resonant wavelength beyond 4 µm. AlAsSb/GaSb mirrors and a unipolar barrier active region paralleling an nBn structure are also used, and performance is compared to a conventional broadband nBn detector incorporating the same superlattice. The RCE PD exhibited a Q-factor of ∼90 and an extremely stable resonance wavelength. Peak responsivity was 3.0 A W−1 at 240 K, equalling 84% quantum efficiency, a 5.5 times increase over the reference nBn at the same wavelength. Dark current density was 3.3×10−2 A cm−2 at 240 K, falling to 2.7×10−4 A cm−2 at 180 K. The broadband BLIP limit is approached at 180 K with specific detectivity of 2.1×1011 cm Hz1/2 W−1, which presents the potential of achieving BLIP-limited operation in the thermoelectric cooling regime.