Search

In this work, 10 nm scandium-doped aluminum nitride (AlScN) capacitors are demonstrated for the construction of the selector-free memory array application. The 10 nm Al0.7Sc0.3N film deposited on an 8-inch silicon wafer with sputtering technology exhibits a large remnant polarization exceeding 100 µC/cm2 and a tight distribution of the coercive field, which is characterized by the positive-up-negative-down (PUND) method. As a result, the devices with lateral dimension of only 1.5 μm show a large memory window of over 250% and a low power consumption of ~40 pJ while maintaining a low disturbance rate of <2%. Additionally, the devices demonstrate stable multistate memory characteristics with a dedicated operation scheme. The back-end-of-line (BEOL)-compatible fabrication process, along with all these device performances, shows the potential of AlScN-based capacitors for the implementation of the high-density selector-free memory array. [ABSTRACT FROM AUTHOR]

In magnetic recording media, the grains or clusters reverse their magnetization over a range of reversal field, resulting in a switching field distribution. In order to achieve high areal densities, it is desirable to understand and minimize such a distribution. Clusters of grains which contain stacking faults (SF) or fcc phase have lower anisotropy, an order lower than those without them. It is believed that such low anisotropy regions reverse their magnetization at a much lower reversal field than the rest of the material with a larger anisotropy. Such clusters/grains cause recording performance deterioration, such as adjacent track erasure and dc noise. Therefore, the observation of clusters that reverse at very low reversal fields (nucleation sites, NS) could give information on the noise and the adjacent track erasure. Potentially, the observed clusters could also provide information on the SF. In this paper, we study the reversal of nucleation sites in granular perpendicular media based on a magnetic force microscope (MFM) methodology and validate the observations with high resolution cross-section transmission electron microscopy (HRTEM) measurements. Samples, wherein a high anisotropy CoPt layer was introduced to control the NS or SF in a systematic way, were evaluated by MFM, TEM, and magnetometry. The magnetic properties indicated that the thickness of the CoPt layer results in an increase of nucleation sites. TEM measurements indicated a correlation between the thickness of CoPt layer and the stacking fault density. A clear correlation was also observed between the MFM results, TEM observations, and the coercivity and nucleation field of the samples, validating the effectiveness of the proposed method in evaluating the nucleation sites which potentially arise from stacking faults. [ABSTRACT FROM AUTHOR]

Electrical and photocurrent characteristics of single Co3O4 nanowire devices were studied systematically. Current-voltage characteristics' measurements and impedance spectroscopy of single Co3O4 nanowire devices were performed and analysed using possible mechanism. Photoresponses of individual nanowires were obtained by global irradiation of laser beams with photon energies above band gap and at sub-band gap of the nanowires. The magnitude of photocurrent and its response time revealed that defect level excitations significantly contribute to the photoresponse of Co3O4 nanowires. In addition, the electrically Ohmic nature of the nanowire/Pt contact and p-type conductivity of Co3O4 nanowire is extracted from the current-voltage characteristics and spatially resolved photocurrent measurements. [ABSTRACT FROM AUTHOR]

This paper reports a comprehensive experimental study on the effects of hydrogen microwave plasma treatment on nonhydrogenated high sp3 content tetrahedral amorphous carbon (ta-C) film. In this study, a surface C–H dipole layer was first observed by high resolution electron energy loss spectroscopy, showing the presence of C–H bonding states. This resulted in the enhancement of electron field emission of the plasma treated films by largely lowering the turn-on field. Thermal stability tests using in situ ultraviolet photoelectron spectroscopy confirm that the C–H dipole layer not only reduces the work function of the films, it is extremely stable in both ambient and vacuum conditions and can sustain up to 600 °C annealing in vacuum. Atomic force microscopy studies also show minimal modifications to the surface morphology, leading to the conclusion that the C–H dipole layer is responsible for lowering the work function. This has improved the electron emission properties which can lead to potential applications such as electron emission displays. [ABSTRACT FROM AUTHOR]

In this paper, magnetic and structural properties of near-equiatomic CoPt thin films, which exhibited a high coercivity in the film-normal direction-suitable for perpendicular magnetic recording media applications-are reported. The films exhibited a larger coercivity of about 6.5 kOe at 8 nm. The coercivity showed a monotonous decrease as the film thickness was increased. The transmission electron microscopy images indicated that the as fabricated CoPt film generally consists of a stack of magnetically hard hexagonal-close-packed phase, followed by stacking faults and face-centred-cubic phase. The thickness dependent magnetic properties are explained on the basis of exchange-coupled composite media. Epitaxial growth on Ru layers is a possible factor leading to the unusual observation of magnetically hard hcp-phase at high concentrations of Pt. [ABSTRACT FROM AUTHOR]

In this paper, a method to improve the magnetic and structural properties of heat-assisted magnetic recording media by applying partial substrate bias during the deposition of FePt-based recording layer is demonstrated. Although the application of a substrate bias for the entire FePt layer deposition deteriorated the media properties, improvements were noted when a substrate bias is selectively applied for the deposition of top portion of the FePt layer. Our experiments suggest that the compressive stress due to the ion peening in the biased deposition degrades the texture and magnetic properties of the FePt media, primarily during the initial phase of FePt film growth. On the other hand, the media fabricated by applying an optimum substrate bias for the deposition of top portion of the FePt layer showed improvements in the micro-structural and magnetic properties. [ABSTRACT FROM PUBLISHER]