27 results on '"Vanhooren, Ronny"'
Search Results
2. Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers
3. DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value
4. Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors
5. Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs
6. Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations
7. Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics
8. Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing
9. Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing
10. Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs
11. An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes
12. ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits
13. Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems
14. Non-intrusive detection of defects in mixed-signal integrated circuits using light activation
15. A very low cost and highly parallel DfT method for analog and mixed-signal circuits
16. Automatic testing of analog ICs for latent defects using topology modification
17. Analog fault coverage improvement using final-test dynamic part average testing
18. Effective DC fault models and testing approach for open defects in analog circuits
19. Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis
20. Automatic generation of lightweight controllability and observability structures for analog circuits
21. Automatic generation of autonomous built-in observability structures for analog circuits
22. Automated testing of mixed-signal integrated circuits by topology modification
23. Design and test of analog circuits towards sub-ppm level
24. Practical random sampling of potential defects for analog fault simulation
25. Automatic generation of lightweight controllability and observability structures for analog circuits.
26. Optimization of analog fault coverage by exploiting defect-specific masking.
27. Comparison of different test strategies on a mixed-signal circuit
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.