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6. Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

9. A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash

12. Liquid Memory and the Future of Data Storage

24. Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P–V and I–V in HfO₂-Based Ferroelectric FET

31. Are patients accurate forecasters of their emotional response to medical conditions? A scoping review on affective forecasting

33. Defect profiling in FEFET Si:HfO2 layers

35. Integration of Ruthenium-based Wordline in a 3-D NAND Memory Devices

43. First Demonstration of $\text{In}_{1-\mathrm{x}}\text{Ga}_{\mathrm{x}}\text{As}$ Macaroni Channel for Future 3-D NAND

47. Diffuse large B-cell lymphoma presenting as a spontaneous rupture of the spleen

48. First demonstration of monocrystalline silicon macaroni channel for 3-D NAND memory devices

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