386 results on '"Van Aert, S."'
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2. Deep convolutional neural networks to restore single-shot electron microscopy images
3. Coupling charge and topological reconstructions at polar oxide interfaces
4. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination
5. Atom counting from a combination of two ADF STEM images
6. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network
7. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection
8. The maximum a posteriori probability rule for atom column detection from HAADF STEM images
9. The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials
10. Berry phase engineering at oxide interfaces
11. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors
12. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution
13. Atom column detection from simultaneously acquired ABF and ADF STEM images
14. Atomic resolution mapping of phonon excitations in STEM-EELS experiments
15. Optimized fabrication of high quality La0.67Sr0.33MnO3 thin films considering all essential characteristics
16. Defect engineering in oxide heterostructures by enhanced oxygen surface exchange
17. Electronically coupled complementary interfaces between perovskite band insulators
18. Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
19. Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurement
20. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques
21. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?
22. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure
23. Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations
24. Atom-counting in High Resolution Electron Microscopy:TEM or STEM – That's the question
25. Locating light and heavy atomic column positions with picometer precision using ISTEM
26. Quantification of 3D atomic structures and their dynamics from scanning transmission electron microscopy data
27. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
28. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
29. Progress and new advances in simulating electron microscopy datasets using MULTEM
30. Low-Dose 4D-STEM tomography for beam-sensitive nanocomposites
31. Quantitative STEM normalisation: The importance of the electron flux
32. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
33. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
34. High-Resolution Visualization Techniques: Structural Aspects
35. Site occupation of Nb atoms in ternary Ni–Ti–Nb shape memory alloys
36. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images
37. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM
38. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis
39. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy
40. The Notion of Resolution
41. Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits?
42. Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations
43. An alternative approach to determine attainable resolution directly from HREM images
44. Direct structure inversion from exit waves. Part II: A practical example
45. Correction of non-linear thickness effects in HAADF STEM electron tomography
46. Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
47. Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits?
48. High precision measurements of atom column positions using model-based exit wave reconstruction
49. A method to determine the local surface profile from reconstructed exit waves
50. Throughput maximization of particle radius measurements through balancing size versus current of the electron probe
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