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2. A fine pitch bump bonding process compatible with the manufacture of the Pixel-HPD's for the LHCb RICH detector

4. Edge pixel response studies of edgeless silicon sensor technology for pixellated imaging detectors

6. Reliability of wafer-level SLID bonds for MEMS encapsulation.

7. Wafer-level AuSn and CuSn bonding for MEMS encapsulation.

8. A Fine Pitch Bump Bonding Process Compatible With the Manufacture of the Pixel-HPD' s for the LHCb RICH Detector.

9. A Fine Pitch Bump Bonding Process compatible with the Manufacture of the Pixel-HPD~s for the LHCb RICH Detector

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