1. ELLIPSOMETRIC STUDY OF SEMITRANSPARENT SILVER LAYERS DEPOSITED ON GLASS
- Author
-
Víctor Toranzos, Jorge O. Zerbino, Alberto Maltz, and Guillermo Ortiz
- Subjects
silver films ,ellipsometry ,effective optical indexes ,metamaterials ,Engineering (General). Civil engineering (General) ,TA1-2040 ,Science (General) ,Q1-390 - Abstract
Using ellipsometry, the film structure is characterized by optical indices n, k (visible region, 450 nm < < 580 nm) and the thickness (15 < d < 35 nm). The optical indices change with the quantity of silver deposited, obtaining effective indices of 1.0 < n < 1.8 and 1.6 < k < 2.6 to the smaller deposits that belong to a volumetric fraction between 0.35 and 0.5 of silver in the air. An effective optical thickness film decrease is observed when the silver volumetric fraction increases, and a thickness increase with close indices to solid silver when the deposited silver increases. Optical and effective medium theory indices are compared.
- Published
- 2014