1. Impact of UV radiation on morphology, structure, and optical properties of tris [2-phenylpyridinato-C2, N]iridium(III) films for optoelectronic applications.
- Author
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El-Damhogi, D. G., Al Huwayz, Maryam, and Elesh, E.
- Subjects
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ULTRAVIOLET radiation , *X-ray diffraction , *THIN films , *OPTICAL properties , *INFRARED spectroscopy , *OPTOELECTRONIC devices - Abstract
Tris [2-phenylpyridinato-C2, N]iridium(III) ( I r (p p y) 3 ) thin films were deposited by thermal evaporation technique at room temperature. These films were examined before and after being irradiated by ultraviolet (UV) radiation for 5, 30, and 60 min. The structural analysis of powder, pristine, and UV-irradiated films has been investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), and infrared spectroscopy. The crystallite size values for pristine and irradiated films are examined using XRD spectra. Furthermore, these data correspond with the data of SEM images which supports the impact of UV radiation on the change of surface aggregation. Three distinct bands can be observed on the absorption spectrum of the films under study: the Soret (B-band), N-band, and C-band, with absorption maxima at 3.67, 4.56, and 4.80 eV, respectively. After 60 min. of the radiation exposure, the optical gap, Eg was slightly changed by approximately 0.18 eV. A few important optical characteristics for the pristine film have been calculated, including the strength of the electronic dipole (q2), the molar-extinction coefficient (ξmolar), the strength of the oscillator (f) for pristine and UV–irradiated films. Ir(ppy)3 film displays homogeneity even after UV irradiation, making them suitable for optoelectronic devices such as UV photodetectors. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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