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The locations of process-induced defects in hydrogenated amorphous silicon thin-film transistors (a-Si:H TFTs), which are used as elements of active-matrix liquid crystal displays, were investigated by combining focused ion beam (FIB) techniques with cross-sectional transmission electron microscopy (X-TEM). The FIB technique is applied to TFT failure-analysis problems which require very localized etching without inducing mechanical stress. We demonstrate how these techniques are used to characterize TFT defects such as thin layers formed from etching residue, microvoids in the multilayers, fragile aluminum whisker protrusions on the electrodes, or portions of the TFT multilayer damaged by mechanical stress.

AbstractTo validate lead (Pb) nuclear cross sections, a series of integral experiments to measure lead void reactivity worth was conducted systematically in three fast neutron spectra with different fuel compositions on the Comet critical assembly of the National Criticality Experiments Research Center. Previous experiments in high-enriched uranium (HEU)/Pb and low-enriched uranium (LEU)/Pb systems had been performed in 2016 and 2017, respectively. A follow-on experiment in a plutonium (Pu)/Pb system has been completed. The Pu/Pb system was constructed using lead plates and weapons-grade Pu plates that had been used in the Zero Power Physics Reactor (ZPPR) of Argonne National Laboratory until the 1990s. Furthermore, the HEU/Pb system was reexamined on the Comet critical assembly with a newly installed device that can measure the compression of the stack, improving reproducibility. Using the lead void reactivity worth measured in these three cores with different fuel compositions, the latest nuclear data libraries, JENDL-4.0 and ENDF/B-VIII.0, were tested with the Monte Carlo calculation code MCNP® version 6.1. As a result, the calculations by ENDF/B-VIII.0 were confirmed to agree with lead void reactivity worth measured in all the cores. It was furthermore found that the calculations by JENDL-4.0 overestimate by more than 20% for the Pu/Pb core while being in good agreement for the HEU/Pb and LEU/Pb cores.

AbstractTo validate lead (Pb) nuclear cross sections, a series of integral experiments to measure lead void reactivity worths was conducted in a high-enriched uranium (HEU)/Pb system and a low-enriched uranium (LEU)/Pb system using the Comet Critical Assembly at the National Criticality Experiments Research Center. There is a follow-on experiment to measure the lead void reactivity worths in a plutonium/Pb system that is currently under investigation. The critical experiments in the two uranium systems were designed to provide complementary data sets having different sensitivities to scattering cross sections of lead. The larger amount of the 238U present in the LEU/Pb core increases the neutron importance above 1 MeV compared with the HEU/Pb core. Since removal of lead from the core shifts the neutron spectrum to the higher energy region, positive lead void reactivity worths were observed in the LEU/Pb core while negative values were observed in the HEU/Pb core. This technical note is a preliminarily report of the experimental analysis results for the lead void reactivity worths with the Monte Carlo calculation code MCNP®version 6.1 together with nuclear data libraries JENDL-4.0 and ENDF/B-VII.1. The calculation values were found to overestimate the negative reactivity worths for the HEU/Pb core while being consistent for the LEU/Pb core.