Author: "Trippe, J. M." - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Trippe, J. M."' showing total 3 results

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3 results on '"Trippe, J. M."'

1. Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model

Author: Trippe, J. M., primary, Reed, R. A., additional, Austin, R. A., additional, Sierawski, B. D., additional, Massengill, L. W., additional, Weller, R. A., additional, Warren, K. M., additional, Schrimpf, R. D., additional, Narasimham, B., additional, Bartz, B., additional, and Reed, D., additional
Published: 2018
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2. Predicting the vulnerability of memories to muon-induced SEUs with low-energy proton tests informed by Monte Carlo simulations

Author: Trippe, J. M., primary, Reed, R. A., additional, Sierawski, B. D., additional, Weller, R. A., additional, Austin, R. A., additional, Massengill, L. W., additional, Bhuva, B. L., additional, Warren, K. M., additional, and Narasimham, B., additional
Published: 2016
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3. Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

Author: Trippe, J. M., primary, Reed, R. A., additional, Austin, R. A., additional, Sierawski, B. D., additional, Weller, R. A., additional, Funkhouser, E. D., additional, King, M. P., additional, Narasimham, B., additional, Bartz, B., additional, Baumann, R., additional, Labello, J., additional, Nichols, J., additional, Schrimpf, R. D., additional, and Weeden-Wright, S. L., additional
Published: 2015
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