10 results on '"Tonigan, Andrew M."'
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2. Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology
3. Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure
4. DFF Layout Variations in CMOS SOI—Analysis of Hardening by Design Options
5. Pulsed Laser-Induced Single-Event Transients in InGaAs FinFETs with sub-10-nm Fin Widths
6. Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts
7. Correlation of a Bipolar-Transistor-Based Neutron Displacement Damage Sensor Methodology With Proton Irradiations
8. Solvent-Assisted Self-Assembly of CsPbBr3 Perovskite Nanocrystals into One-Dimensional Superlattice
9. The Development of a High Sensitivity Neutron Displacement Damage Sensor
10. Solvent-Assisted Self-Assembly of CsPbBr3Perovskite Nanocrystals into One-Dimensional Superlattice
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