1. Measurement of the Width of Emission Spectra by a Waveguide Technique.
- Author
-
Shulga, V. and Khomchenko, A.
- Subjects
- *
EMISSION spectroscopy , *SPATIAL distribution (Quantum optics) , *LASER beams , *EXCITATION spectrum , *OPTICAL waveguides , *SEMICONDUCTOR diodes , *SEMICONDUCTOR lasers - Abstract
The dependence of the spatial distribution of the recorded m-line intensity on the frequency characteristics of a light beam is studied for excitation of waveguide modes in thin-film structures. Semiconductor diodes with emission peaks at 635-670 nm, an He-Ne laser, and light from an incandescent lamp passed through a monochromator are used as light sources with different spectral widths. Thin-film waveguides with high chromatic dispersion are fabricated using multilayer TiO-SiO and ZrO-SiO structures. [ABSTRACT FROM AUTHOR]
- Published
- 2014
- Full Text
- View/download PDF