1. Topology-related upset mechanisms in design hardened storage cells
- Author
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Michael Nicolaidis, V.T. Tran, R. Koga, K. Clark, Steven C. Moss, Stephen LaLumondiere, Raoul Velazco, T. Calin, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, The Aerospace Corporation, US. Air Force (SMCIAXE), US. Air Force, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), and The Aerospace Corporation (THE AEROSPACE CORPORATION)
- Subjects
Engineering ,single-event-upset ,Integrated circuit design ,Hardware_PERFORMANCEANDRELIABILITY ,CMOS-storage-cell ,Network topology ,01 natural sciences ,Upset ,law.invention ,Computer Science::Hardware Architecture ,law ,0103 physical sciences ,Electronic engineering ,Redundancy (engineering) ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,latch-redundancy ,isolation ,010302 applied physics ,010308 nuclear & particles physics ,business.industry ,design ,laser-beam-simulation ,Laser ,charge-collection ,spacing ,CMOS ,Single event upset ,PACS 85.42 ,SEU-hardness ,device-topology ,business ,Excitation - Abstract
The SEU hardness of a new CMOS storage cell based on latch redundancy has been analyzed using a laser beam simulation. We detected and investigated topology-dependent upset mechanisms due to charge collection at two sensitive nodes using a laser excitation between the nodes. Compact upset-immune device topologies are proposed, using spacing and isolation techniques for simultaneously sensitive node pairs, to achieve high immunity levels required in critical applications.
- Published
- 1998