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1. Analysis of Single Missing Gate Faults in Quantum Circuit

3. Galois self-dual cuspidal types and Asai local factors.

5. Critique on Signature Analysis Using Cellular Automata and Linear Feedback Shift Register

7. Delay Testing Based on Multiple Faulty Behaviors

8. A Novel Sparsity Based Classification Framework to Exploit Clusters in Data

9. Assisted Coverage Closure

12. Improved Test Pattern Generation for Hardware Trojan Detection Using Genetic Algorithm and Boolean Satisfiability

13. FudgeFactor: Syntax-Guided Synthesis for Accurate RTL Error Localization and Correction

16. A new test vector optimization method for failure isolation

18. Using BLAKE

19. Back-To-Back Testing of Model-Based Code Generators

20. True Error or False Alarm? Refining Astrée’s Abstract Interpretation Results by Embedded Tester’s Automatic Model-Based Testing

23. NoC Verification and Testing

28. On the Origin of Yet another Channel

29. Towards Beneficial Hardware Acceleration in HAVEN: Evaluation of Testbed Architectures

30. ML Confidential: Machine Learning on Encrypted Data

36. A Process Algebra Based Strategy for Generating Test Vectors from SCR Specifications

42. On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

43. Fuzzing: Cyberphysical System Testing for Security and Dependability

45. Dynamic Ensemble Selection for Off-Line Signature Verification

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