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1. Magnetic sub-micron rods for quantitative viscosity imaging using heterodyne holography

Author

Gentner, C., Berret, J. -F., Berto, P., Reichman, S., Kuszelewicz, R., and Tessier, G.

Subjects
Physics - Optics
Abstract

Many processes in microfluidics and biology are driven or affected by viscosity. While several methods are able to measure this parameter globally, very few can provide high resolution viscosity images. Optimizing the locality of viscosity measurements demands smaller probes but also shorter lateral diffusion lengths and measurement times. Here, we propose to use sub-micrometer magnetic rods to perform high resolution viscosity imaging. An external magnetic field forces the oscillation of superparamagnetic iron oxide rods. Under linearly polarized illumination, the rotation of these highly anisotropic optical scatterers induces a blinking which is analyzed by heterodyne holography. The spectral analysis of the rotation dynamics yields a regime transition frequency from which the local viscosity is deduced. Holography provides a 3D optical field reconstruction and 3D superlocalization of the rods, which allows super-resolved viscosity measurements. Relying on the fast Brownian rotation instead of the slower translation component of nanorods therefore allows faster measurements and, crucially, smaller effective voxels for viscosity determination. We thus demonstrate that viscosity imaging is possible with a 0.5 (micron)^3 3D-resolution., Comment: 14 pages, 4 figures, 49 references

Published
2024
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2. Magnetic nanorods for quantitative viscosity imaging using heterodyne holography

Author

Gentner, C., Berto, P., Berret, J. -F., Reichman, S., Kuszelewicz, R., and Tessier, G.

Subjects
Physics - Instrumentation and Detectors, Physics - Biological Physics
Abstract

Many processes in microfluidics and biology are driven or affected by viscosity. While several methods are able to measure this parameter globally (AFM, surface acoustic waves, DLS, ...), very few can provide high resolution viscosity images, particularly in living cells. Here, we propose to use sub-micrometer magnetic rods to perform high resolution viscosity imaging. An external magnetic field forces the oscillation of superparamagnetic iron oxide nanorods. Under linearly polarized illumination, the rotation of these highly anisotropic optical scatterers induces a blinking which is analyzed by heterodyne holography. The spectral analysis of the rotation dynamics yields a regime transition frequency f t from which the local viscosity is deduced. Holography provides 3D image reconstruction and 3D superlocalization of the nanorods, which allows super-resolved viscosity measurements. Relying on the fast Brownian rotation of nanorods instead of their slower translation therefore allows faster measurements and, crucially, smaller effective voxels for viscosity determination. Viscosity imaging is demonstrated with a 0.5 {\mu}m 3 3D resolution., Comment: 17 pages, 6 figures, Supplementary Information

Published
2023

3. Electro-elastic coupling modelling from multiple wavelengths imaging microscopy

Author

Roger J.P., Tessier G., Fedala Y., Kanoufi F., Flammier C., and Amiot F.

Subjects
Physics, QC1-999
Abstract

Due to their ability to interact with their environment, the interest in microcantilever sensors in biological or chemical applications is increasing. Moreover measurement of the sensor bending induced by molecular adsorption is improved by electrochemical actuation of the cantilever. This is why modelling the electro-elastic coupling is a key issue. Different methods are used to measure the bending induced by this electrochemical actuation. Among them, multiple wavelengths imaging microscopy provides full-field measurements. The local surface electrical charge density and the deformation field are obtained by decoupling wavelength-dependent and –independent contributions to the collected intensity. Based on a modelling of the electro-elastic coupling and on these full-field measurements, an identification method of the coupling parameters of the system is proposed herein.

Published
2010
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4. 3D exploration of light scattering from live cells in the presence of gold nanomarkers using holographic microscopy

Author

Joud, Fadwa, Warnasooriya, N., Bun, P., Verpillat, Frédéric, Suck, Sarah Y., Tessier, G., Atlan, Michael, Desbiolles, Pierre, Coppey-Moisan, Maite, Abboud, Marie, and Gross, Michel

Subjects
Physics - Optics
Abstract

In this paper, we explore the 3D structure of light scattering from dark-field illuminated live 3T3 cells in the presence of 40 nm gold nanomarkers. For this purpose, we use a high resolution holographic microscope combining the off-axis heterodyne geometry and the phase-shifting acquisition of the digital holograms. A comparative study of the 3D reconstructions of the scattered fields allows us to locate the gold markers which yield, contrarily to the cell structures, well defined bright scattering patterns that are not angularly titled and clearly located along the optical axis (z). This characterization is an unambiguous signature of the presence of gold biological nanomarkers, and validates the capability of digital holographic microscopy to discriminate them from background signals in live ce

Published
2011

7. The short-term impact and sustainability of multiple lifestyle interventions on metabolic health and remission of prediabetes and type 2 diabetes: a two-year experience

Author

Iglesies-Grau, J, primary, Dionne, V, additional, Latour, É, additional, Pelletier, V, additional, Bisaillon, M, additional, Tessier, G, additional, Aubut, L, additional, Hamrioui, N, additional, Gagnon, C, additional, Simard, F, additional, Nigam, A, additional, L Allier, PL, additional, Bherer, L, additional, Bouabdallaoui, N, additional, and Juneau, M, additional

Published
2022
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9. Limited impact of deforestation- and conversion-free soy supply chains from South America on European producer and consumer prices

Author

Senesi, S., Martinez, U., Daziano, M., Dal Pont, S., Tessier, G., Timmers, J.F.P., Silva, D., Aertsens, J., Hoste, R., Senesi, S., Martinez, U., Daziano, M., Dal Pont, S., Tessier, G., Timmers, J.F.P., Silva, D., Aertsens, J., and Hoste, R.

Abstract

The EU is developing a law to ban the placing on the market of products associated with deforestation and forest degradation. This report estimates the impact of this law on soy supply chains, on EU producers feeding their animals partly with soy (meal), and on consumer products where soy is embedded. More concretely, this study estimates the extra cost of deforestation-and conversion-free(DCF)soy supply from Argentina and Brazil to the EU and the impact on the price of production and consumption in the EU, for e.g. pig meat, chicken meat, milk, beef, salmon and eggs. The study points out that for Argentina, in the highest-cost scenario, for a single trader who sets up a segregated DCF supply to the EU, these extra costs are about 1% of the cost of producing and exporting soy to the EU. In a more probable scenario, where Argentinian traders collaborate to setup a 100% DCF supply,the costs per tonne are three times lower. For Brazil the costs are estimated to be 10-20timeslowerthan for Argentina. This is due to the larger volumes exported from Brazil and reflects actions already taken in Brazil, including to comply with the Amazon Soy Moratorium. These costs will have very limited impact in the EU.With the highest-cost scenario for Argentina, the extra cost represents up to 0.2% of the average turnover of specialized farms in The Netherlands producing pigs, chicken meat, eggs or dairy. We estimate a slight decrease in the income of these producers of animal products in a transition period, varying between 0.3% for dairy farmers and 3% for pig farms, laying hen farms and poultry farms.In the “most probable scenario” the income for the farmers is estimated to decrease by up to 0.6% in a transition period.When the EU regulation is implemented, however, all European producers will switch to DCF soy for animal feed, and this cost increase will be passed on to the subsequent links in the supply chain through the functioning of the market. After the transition period, which, The EU is developing a law to ban the placing on the market of products associated with deforestation and forest degradation. This report estimates the impact of this law on soy supply chains, on EU producers feeding their animals partly with soy (meal), and on consumer products where soy is embedded. More concretely, this study estimates the extra cost of deforestation-and conversion-free(DCF)soy supply from Argentina and Brazil to the EU and the impact on the price of production and consumption in the EU, for e.g. pig meat, chicken meat, milk, beef, salmon and eggs. The study points out that for Argentina, in the highest-cost scenario, for a single trader who sets up a segregated DCF supply to the EU, these extra costs are about 1% of the cost of producing and exporting soy to the EU. In a more probable scenario, where Argentinian traders collaborate to setup a 100% DCF supply,the costs per tonne are three times lower. For Brazil the costs are estimated to be 10-20timeslowerthan for Argentina. This is due to the larger volumes exported from Brazil and reflects actions already taken in Brazil, including to comply with the Amazon Soy Moratorium. These costs will have very limited impact in the EU.With the highest-cost scenario for Argentina, the extra cost represents up to 0.2% of the average turnover of specialized farms in The Netherlands producing pigs, chicken meat, eggs or dairy. We estimate a slight decrease in the income of these producers of animal products in a transition period, varying between 0.3% for dairy farmers and 3% for pig farms, laying hen farms and poultry farms.In the “most probable scenario” the income for the farmers is estimated to decrease by up to 0.6% in a transition period.When the EU regulation is implemented, however, all European producers will switch to DCF soy for animal feed, and this cost increase will be passed on to the subsequent links in the supply chain through the functioning of the market. After the transition period, which

Published
2022

14. Hollow-core fibers with ultralow loss in the ultraviolet range and sub-thermodynamic equilibrium surfaceroughness

Author

Osório, J, Amrani, F, Delahaye, F, Dhaybi, A, Vasko, K, Tessier, G, Giovanardi, F, Vincetti, L, Debord, B, Gérôme, Frédéric, Benabid, F, Photonique Fibre et Sources Cohérentes (XLIM-PHOT), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS), GLOphotonics S.A.S., Institut de la Vision, Centre National de la Recherche Scientifique (CNRS)-Sorbonne Université (SU)-Institut National de la Santé et de la Recherche Médicale (INSERM), Department of Engineering 'Enzo Ferrari', Gerome, Frédéric, Institut National de la Santé et de la Recherche Médicale (INSERM)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), and OSA

Subjects
[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, FOS: Physical sciences, Optics (physics.optics), Physics - Optics
Abstract

We report on hollow-core fibers displaying rms core roughness under the surface capillary waves thermodynamic limit and record loss in the short-wavelength range (50.0 dB/km at 290 nm, 9.7 dB/km at 369 nm, 5.0 dB/km at 480 nm, 0.9 dB/km at 558 nm, 1.8 dB/km at 719 nm)., 5 pages, 3 figures

Published
2021

17. Direct measurement of the polarization-dependent absorption and saturation in an InGaAs/InGaAsP single quantum well

Author

Gontijo, I., Tessier, G., Livingstone, M., Galbraith, I., and Walker, A.C.

Subjects
Quantum wells -- Research, Nanotechnology -- Research, Physics
Abstract

A simple method was utilized to measure the two polarization-dependent absorption edges in a single quantum well around 1.5 microns. The broadband spontaneous emission of an AR-coated semiconductor laser chip was employed as the spatially coherent light source in conjunction with a grating spectrometer. Absorption edges for both TE and TM polarized light were measured in single quantum well InGaAs/InGaAsP waveguides and modeled by the k.p technique. The changes in the refractive index were computed from a Kramers-Kronig transformation of the absorption changes.

Published
1996

18. Sensitivity enhancement in thermoreflectance microscopy of semiconductor devices using suitable probe wavelengths.

Author

de Freitas, L. R., da Silva, E. C., Mansanares, A. M., Tessier, G., and Fournier, D.

Subjects
SEMICONDUCTORS, REFLECTANCE spectroscopy, POLYCRYSTALS, ELECTRIC conductivity, ELECTRICAL engineering materials, CRYSTALS, PHYSICS
Abstract

In this paper we present an experimental and theoretical study of the thermoreflectance response as a function of the probe wavelength for layered microelectronics structures. The investigated sample consists of a polycrystalline silicon conducting track grown on a SiO2-coated Si substrate. Thermoreflectance measurements were carried out in the wavelength range from 450 to 750 nm with the track biased in modulated regime. An oscillating pattern is observed in the spectral region where the upper layer is transparent. Such oscillations are due to the interference resulting from the multiple reflections at the interfaces. Using a thermo-optical model, we show that the optical constants (n and k) of the materials, which are wavelength dependent, as well as their temperature derivatives (dn/dT and dk/dT), strongly influence the thermoreflectance signal. The optical thicknesses of the layers, mainly determined by the real part of the refractive indices, define the period of oscillation. On the other hand, the imaginary part of the refractive indices establishes the cutoff wavelength of the oscillations. Below this cutoff wavelength, the probe light does not penetrate the material and the upper-surface reflectance dominates the signal. [ABSTRACT FROM AUTHOR]

Published
2005
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21. Technical report describing the thermophysical measurementsmethods specifications

Author

Aigouy, L., Roger, J.-P., Tessier, G., Bezencenet, O., Hay, B., Ras, Mohamad Abo, Schlag, R., ALZINA, F., Sotomayor Torres , C., Chapuis, P.-O., Gomès, S., Klapetek, Petr, Vairac, P., Teyssieux, D., Thiery, L., Euphrasie, S., Briand, D., Dobson, P., Weaver, J., Kolosov, O., Trannoy, N., Mills, G., ESPCI ParisTech, Institut Langevin - Ondes et Images, Université Paris Diderot - Paris 7 (UPD7)-ESPCI ParisTech-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Université Paris Descartes - Paris 5 (UPD5), Thales (France), Laboratoire National de Métrologie et d'Essais [Trappes] (LNE ), Berliner Nanotest und Design GmbH, Centre d'Energétique et de Thermique de Lyon (CETHIL), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Cesky Metrologicky Institut Brno (CMI), Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Franche-Comté (UFC)-Centre National de la Recherche Scientifique (CNRS)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Technologie de Belfort-Montbeliard (UTBM), Ecole Polytechnique Fédérale de Lausanne (EPFL), University of Glasgow, Department of Physics [Lancaster], Lancaster University, Université de Reims Champagne-Ardenne (URCA), KNT, ESPCI ParisTECH, European Project: 604668,EC:FP7:NMP,FP7-NMP-2013-LARGE-7,QUANTIHEAT(2013), Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL), Institut Langevin - Ondes et Images (UMR7587) (IL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), THALES [France], Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Centre National de la Recherche Scientifique (CNRS)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC), Sorbonne Université (SU)-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Université de Paris (UP)-Centre National de la Recherche Scientifique (CNRS), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC), and Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[SPI]Engineering Sciences [physics]
Published
2014

22. [Proceedings of the 5th Symposium on Mesozoic and Cenozoic Decapod Crustaceans, Krakow, Poland, 2013: A tribute to Pál Mihály Müller / R.H.B. Fraaije, M. Hyžný, J.W.M. Jagt, M. Krobicki & B.W.M. van Bakel (eds.)]: A re-evaluation of extinct European crabs referred to the genus Calappilia A. Milne Edwards in Bouillé, 1873 (Brachyura, Calappidae)

Author

Busulini, A., Beschin, C., Tessier, G., and Naturalis journals & series

Subjects
Brachyura, reassessment, Neogene, Calappidae, Paleogene
Abstract

A reassessment of extinct species, fourteen in all, found in Europe and attributed to Calappilia has been carried out. For each species a short diagnosis is provided, and where necessary, its systematic position is reconsidered. Calappilia dacica lyrata is here elevated to species rank, while C. mainii is reassigned to Stenodromia A. Milne Edwards in Bouillé, 1873 and C. sexdentata is considered to be a nomen nudum. Photographs are provided of all type specimens available to us; most of these had so far been known only from (partially inaccurate) line drawings. For the first time, well-preserved chelipeds are described for the genus, having been found in articulation with a carapace of C. dacica.

Published
2014

23. Epitaxial growth of AlN thin films at low temperature by magnetron sputtering technique

Author

Camus, J., Simon, Quentin, Ait Aissa, K., BENSALEM, S., Le Brizoual, L., Tessier, G., Scudeller, Y., Djouadi, M. A., Cordier, Y., Frayssinet, E., Chmielowska, M., Nemoz, M., Vennegues, P., Chenot, Sébastien, Defrance, N., Lesecq, M., ALTUNTAS, P., Cutivet, A., AGBOTON, A., De Jaeger, J.C., Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), and Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

Subjects
[SPI]Engineering Sciences [physics]
Published
2013

27. Simultaneous measurement of kinematic and complementary fields for MEMS structures

Author

Garraud, N., Amiot, F., Tessier, G., Roger, J. P., Francois Hild, Laboratoire d'Optique Physique (UPR0005) (LOP), Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Mécanique et Technologie (LMT), École normale supérieure - Cachan (ENS Cachan)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Centre National de la Recherche Scientifique (CNRS)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC), Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC), and Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[SPI.MECA]Engineering Sciences [physics]/Mechanics [physics.med-ph], ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2008

28. Ultra-Local temperature mapping with an intrinsic thermocouple

Author

Vairac, P., Cretin, B., Charlot, B., Dilhaire, S., Gomes, S., Tessier, G., Centre de Thermique de Lyon (CETHIL), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), TIMA Editions, and CETHIL, Laboratoire

Subjects
[PHYS.MECA.THER] Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph], [SPI.MECA.THER]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Thermics [physics.class-ph], [PHYS.MECA.THER]Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph], ComputingMilieux_MISCELLANEOUS, [SPI.MECA.THER] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Thermics [physics.class-ph]
Abstract

International audience

Published
2005

29. Quantitative thermoreflectance imaging : calibration method and validation on dedicated integrated circuit

Author

Tessier, G., Pavageau, S., Filloy, C., Charlot, B., Jerosolimski, G., Fournier, D., Cretin, B., Dilhaire, S., Gomes, S., Trannoy, N., Vairac, P., Volz, S., Centre de Thermique de Lyon (CETHIL), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), and CETHIL, Laboratoire

Subjects
[PHYS.MECA.THER] Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph], [SPI.MECA.THER]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Thermics [physics.class-ph], [PHYS.MECA.THER]Physics [physics]/Mechanics [physics]/Thermics [physics.class-ph], ComputingMilieux_MISCELLANEOUS, [SPI.MECA.THER] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Thermics [physics.class-ph]
Abstract

International audience

Published
2005

30. Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques

Author

Grauby, Stéphane, Salhi, A., Patino Lopez, L.D., Dilhaire, S., Charlot, B., Claeys, W., Cretin, B., Tessier, G., Trannoy, N., Vairac, P., Volz, S., Centre de physique moléculaire optique et hertzienne (CPMOH), Université Sciences et Technologies - Bordeaux 1 (UB)-Centre National de la Recherche Scientifique (CNRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Micro et nanothermique (MN), Université Sciences et Technologies - Bordeaux 1 (UB)-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), TIMA Editions, Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-ESPCI ParisTech, and Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris)

Subjects
[INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], Thermal imaging, scanning thermal microscopy, spatial resolution
Abstract

Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920); International audience; We have studied temperature variations on two dissipative structures with two different techniques. The dissipative structures are constituted of thin (0.35µm) dissipative resistors, the distance between two resistors being equal to 0.8 or 10 µm. On one hand, we have used a thermoreflectance imaging technique which is a well-known non contact optical method to evaluate temperature variations but whose spatial resolution is limited by diffraction. On the other hand, we have used a Scanning Thermal Microscope (SThM) to study the thermal behaviour of these small dissipative structures. We compare qualitative results obtained by both methods and we present their advantages and limitations for temperature measurements on microelectronic devices.

Published
2005

31. Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit

Author

Tessier, G., Pavageau, S., Filloy, C., Charlot, B., Jerosolimski, G., Fournier, D., Cretin, B., Dilhaire, S., Gomes, S., Trannoy, N., Vairac, P., Volz, S., Laboratoire de Spectroscopie en Lumière Polarisée (LSLP), Université Pierre et Marie Curie - Paris 6 (UPMC)-ESPCI ParisTech-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Micro et nanothermique (MN), Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-ESPCI ParisTech, Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), and Université Sciences et Technologies - Bordeaux 1 (UB)-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris)

Subjects
[INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], thermal mapping, Thermoreflectance
Abstract

Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920); International audience; We have developed a CCD-based thermoreflectance microscope which can deliver thermal images of working integrated circuits.

Published
2005

32. Quantitative thermal imaging of GalnAsSb/AlGaAsSb laser diodes by thermoreflectance

Author

Tessier, G., Salhi, A., Rouillard, Y., Genty, F., Roger, J., Montel, F., Fournier, D., Laboratoire de Spectroscopie en Lumière Polarisée (LSLP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Matériaux Optiques, Photonique et Systèmes (LMOPS), CentraleSupélec-Université de Lorraine (UL), Chercheur indépendant, Centre scientifique et Technique Jean Feger (CSTJF), TOTAL FINA ELF, Laboratoire de l'Accélérateur Linéaire (LAL), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Université Pierre et Marie Curie - Paris 6 (UPMC)-ESPCI ParisTech-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS, [SPI.TRON]Engineering Sciences [physics]/Electronics
Abstract

International audience

Published
2005

33. Temperature Measurement of Microsystems by Scanning Thermal Microscopy

Author

Gomès, S., Chapuis, O., Nepveu, F., Trannoy, N., Volz, S., Charlot, B., Tessier, G., Dilhaire, S., Cretin, B., Vairac, P., Laboratoire de Spectroscopie en Lumière Polarisée (LSLP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physico-Chimie des Matériaux Luminescents (LPCML), Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Spectroscopie en Lumière Polarisée ( LSLP ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -ESPCI ParisTech-Centre National de la Recherche Scientifique ( CNRS ), Laboratoire de Physico-Chimie des Matériaux Luminescents ( LPCML ), Université Claude Bernard Lyon 1 ( UCBL ), Université de Lyon-Université de Lyon-Centre National de la Recherche Scientifique ( CNRS ), Techniques of Informatics and Microelectronics for integrated systems Architecture ( TIMA ), Université Joseph Fourier - Grenoble 1 ( UJF ) -Institut polytechnique de Grenoble - Grenoble Institute of Technology ( Grenoble INP ) -Institut National Polytechnique de Grenoble ( INPG ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Grenoble Alpes ( UGA ), Génome, Population, Interactions, Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Micro et nanothermique (MN), Université Sciences et Technologies - Bordeaux 1 (UB)-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), Torella, Lucie, Université Pierre et Marie Curie - Paris 6 (UPMC)-ESPCI ParisTech-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), and Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

Subjects
[INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], thermal-analysis, temperature-measurement, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, PACS 85.42, [ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Scanning Thermal Microscopy Temperature measurement Thermal analysis techniques Thermal-resistive probe
Abstract

Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920); International audience; Surface temperature measurements were performed with a Scanning Thermal Microscope. We aim at proving an eventual sub-micrometric resolution of this metrology when using a wollaston wire probe of micrometric size. A dedicated CMOS device was designed with arrays of lines 0.35mm in size with 0.8 mm and 10mm periods. Integrated Circuits with or without a passivition layer were tested. To enhance sensitivity, the IC heat source was excited with an AC current. We show that the passivation layer spreads heat so that the lines are not distinguishable. Removing this layer allows us to distinguish the lines in the case of the 10mm period.

Published
2005

35. Quantitative thermal imaging of GaInAsSb/AlGaAsSb laser diodes by thermoreflectance

Author

Tessier, G., Salhi, A., Rouillard, Y., Genty, F., Roger, J-P., Fournier, D., Laboratoire d'Optique Physique (UPR0005) (LOP), Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Institut de pharmacologie et de biologie structurale (IPBS), Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), and Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées

Subjects
ComputingMilieux_MISCELLANEOUS, [SPI.TRON]Engineering Sciences [physics]/Electronics
Abstract

International audience

Published
2004

36. Picometer-scale surface roughness measurements inside hollow glass fibres

Author

Brun, C., primary, Buet, X., additional, Bresson, B., additional, Capelle, M. S., additional, Ciccotti, M., additional, Ghomari, A., additional, Lecomte, P., additional, Roger, J. P., additional, Petrovich, M. N., additional, Poletti, F., additional, Richardson, D. J., additional, Vandembroucq, D., additional, and Tessier, G., additional

Published
2014
Full Text
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38. Étude d'interfaces magnétiques par doublage de fréquence optique

Author

Tessier, G., Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Université Paris Sud - Paris XI, and Patrick Georges

Subjects
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], plasmon surface, génération harmonique 2, optique non linéaire, Physique : domaines classiques de la physique (y compris les applications) étude expérimentale, interface solide solide, effet magnétooptique
Abstract

Le doublage de frequence optique est un phenomene optique non lineaire impossible dans le volume des materiaux amorphes ou centrosymetriques, mais pouvant exister aux interfaces entre deux materiaux quelconques. De plus, des contributions supplementaires apparaissent en presence d'une aimantation dans l'un des materiaux. Nous avons utilise ce phenomene pour etudier selectivement la structure et le magnetisme d'interfaces enterrees entre couches metalliques ultraminces (quelques plans atomiques). Pour cela, un systeme sensible a des puissances aussi faibles que 10 1 8 w a ete developpe. Sur un systeme simple, une surface d'or, une correlation claire a ete observee entre doublage de frequence et rugosite mesuree par microscopie a force atomique. Dans le systeme au/co/au, l'identite des proprietes magnetiques en volume et a la surface du cobalt est prevue theoriquement. C'est ce qu'ont confirme des mesures effectuees par effet kerr magneto-optique (en volume) et par doublage de frequence (aux interfaces). L'utilisation de plasmons de surface, augmentant considerablement le champ electrique en surface, peut egalement induire dans ce systeme d'importantes exaltations du doublage de frequence, qui ont ete modelisees. En revanche, dans le systeme pt/co/pt, la presence d'alliages aux interfaces nous a permis de mettre en evidence des differences entre le magnetisme a la surface et dans le volume du cobalt. Parallelement, un systeme d'imagerie de domaines magnetiques aux interfaces par doublage de frequence a ete developpe, permettant une resolution laterale de l'ordre du micrometre. Enfin, nous avons mis en evidence des proprietes magnetiques differentes aux deux interfaces d'une meme couche de fesi, dans un systeme sio 2/fesi/dyfeco proche de ceux utilises pour l'enregistrement magneto-optique.

Published
1999

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