249 results on '"Tay, C.J."'
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2. A generalized multi-sensitivity temporal phase unwrapping method for absolute phase retrieval
3. A modified phase-coding method for absolute phase retrieval
4. Cryptanalysis of an information encryption in phase space
5. A derivative based simplified phase tracker for a single fringe pattern demodulation
6. Asymmetric optical image encryption based on an improved amplitude–phase retrieval algorithm
7. Determination of phase derivatives from a single fringe pattern using Teager Hilbert Huang transform
8. Optical color image encryption without information disclosure using phase-truncated Fresnel transform and a random amplitude mask
9. Nonlinear multiple-image encryption based on mixture retrieval algorithm in Fresnel domain
10. Investigation of phase error correction for digital sinusoidal phase-shifting fringe projection profilometry
11. Blind phase error suppression for color-encoded digital fringe projection profilometry
12. A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry
13. Application of least-square estimation in white-light scanning interferometry
14. Phase retrieval in two-wavelength DSSI using a combined filtering method
15. Numerical reconstruction in in-line digital holography by translation of CCD position and gradient operator method
16. Two wavelength simultaneous DSPI and DSP for 3D displacement field measurements
17. Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry
18. Phase retrieval in DSSI for relatively large deformation
19. Phase-retrieval techniques in fringe-projection profilometry
20. Color image encryption based on interference and virtual optics
21. An improved windowed Fourier transform for fringe demodulation
22. Phase retrieval of speckle fringe pattern with carriers using 2D wavelet transform
23. Dynamic measurement by digital holographic interferometry based on complex phasor method
24. Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry
25. Investigation of a dual-layer structure using vertical scanning interferometry
26. Analysis of phase distortion in phase-shifted fringe projection
27. A study on carrier-removal techniques in fringe projection profilometry
28. Surface profiling using fringe projection technique based on Lau effect
29. Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry
30. Lau phase interferometry with a vibrating object
31. Effect of Phase-Shifting Error on Deformation Evaluation Using Phase-Shifting Digital Holography
32. Optical Interferometric Inspection of Surface Contour of MEMS-Components
33. The Effect of Strain-Hardening and Process Parameters on the Forgeability of Wrought Magnesium Alloys
34. Roughness measurement using speckle photography
35. 3-D deformation measurement using fringe projection and digital image correlation
36. A genetic optical interferometric inspection on micro-deformation
37. Surface roughness investigation of semi-conductor wafers
38. Surface profile measurement of low-frequency vibrating objects using temporal analysis of fringe pattern
39. Whole-field determination of surface roughness by speckle correlation
40. Multiple-image shearography: a direct method to determine curvatures
41. Analysis of shearogram reconstruction
42. Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering model
43. Microscopic surface contouring by fringe projection method
44. The use of circular optical grating for measuring angular rotation of mirrors
45. Design of an optical probe for testing surface roughness and micro-displacement
46. Study of collimating laser diode beam by a graded-index optical fibre
47. Whole field surface roughness measurement by laser speckle correlation technique
48. Collimating of diverging laser diode beam using graded-index optical fiber
49. Inspection of micro-cracks on solderball surface using a laser scattering method
50. Optical measurement of Young's modulus of a micro-beam
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