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Metallic layers are known to be used for the suppression of wave transmission when their thickness is sufficiently higher than the skin depth of metal. If in addition to blocking the transmission, metallic layers have the feature of blocking the reflection, too, they would make perfect absorbers. In this work, we propose an experimental approach of using a single thin layer of Manganese (Mn) as both the transmission suppresser and the reflection suppresser. This approach leads to obtaining lithography-free ultra-broadband perfect absorption in an ultra-wide spectrum ranging from Ultraviolet (UV) to Far Infrared (FIR). The measured average absorption is approximately 99%. Such a promising result can be achieved by only coating a single Mn layer on high-roughness substrates that include random nano-pyramids on it. In other words, we do not need a stack of different materials and combinations of geometrical features. The high roughness is realized on a commercial Silicon wafer substrate by inductively coupled plasma (ICP) etching. The key to this ultra-wideband absorption is electromagnetic field tapering which exists due to the graded-index feature of the structure (known as moth-eye effect), along with the ideal optical properties of Mn which makes it an excellent metal for broadband absorption applications. A full experimental characterization of the fabricated samples is presented along with the physical analysis of the phenomena. The findings of this paper can be used for the realization of lithography-free, cost-effective and high-throughput mass production of broadband absorbers., Comment: 15 pages, 7 figures

In this letter, a new approach to perform edge detection is presented using an all-dielectric CMOS-compatible metasurface. The design is based on guided-mode resonance which provides a high quality factor resonance to make the edge detection experimentally realizable. The proposed structure that is easy to fabricate, can be exploited for detection of edges in two dimensions due to its symmetry. Also, the trade-off between gain and resolution of edge detection is discussed which can be adjusted by appropriate design parameters. The proposed edge detector has also the potential to be used in ultrafast analog computing and image processing.