Author: "Tang, B.J." - Searchworks@Jio Institute Digital Library Search Results

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5 results on '"Tang, B.J."'

1. Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations

Author: Tang, B.J., primary, Zhang, W.D., additional, Breuil, L., additional, Robinson, C., additional, Wang, Y.Q., additional, Toledano-Luque, M., additional, Van den Bosch, G., additional, Zhang, J.F., additional, and Van Houdt, J., additional
Published: 2014
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2. As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability

Author: Tang, B.J., primary, Croes, K., additional, Barbarin, Y., additional, Wang, Y.Q., additional, Degraeve, R., additional, Li, Y., additional, Toledano-Luque, M., additional, Kauerauf, T., additional, Bömmels, J., additional, Tőkei, Zs., additional, and De Wolf, I., additional
Published: 2014
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3. Defects characterization of Hybrid Floating Gate/Inter-Gate Dielectric interface in Flash memory

Author: Zahid, M. B., primary, Degraeve, R., additional, Breuil, L., additional, Blomme, P., additional, Lisoni, J. G., additional, Van den Bosch, G., additional, Van Houdt, J., additional, and Tang, B.J., additional
Published: 2014
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4. Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations

Author: Tang, B.J., primary, Zhang, W.D., additional, Zhang, J.F., additional, Van den bosch, G., additional, Govoreanu, B., additional, and Van Houdt, J., additional
Published: 2011
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5. Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations.

Author: Tang, B.J., Zhang, W.D., Zhang, J.F., Van den bosch, G., Govoreanu, B., and Van Houdt, J.
Published: 2011
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