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1. Self-referencing photothermal common-path interferometry to measure absorption of Si3N4 membranes for laser-light sails

2. Properties of Shape-Engineered Phoxonic Crystals: Brillouin-Mandelstam Spectroscopy and Ellipsometry Study

4. Alignment and overlay through opaque metal layers

9. Atomic layer deposition of LiF using LiN(SiMe3)2 and SF6 plasma

14. Ellipsometry provides detailed analysis of infrared optical thin films: modern IR-spectroscopic ellipsometry instruments and data analysis software provide accurate and repeatable thickness and optical property measurements of substrates and film samples

17. Spectroscopic ellipsometry for polymer thin films

18. Spectroscopic ellipsometry for process applications

19. Tape casting and characterizations of MgO ceramics.

20. Ground and space based optical analysis of materials degradation in low-Earth-orbit

23. Solid Tellurite Optical Fiber Based on Stack-and-Draw Method for Mid-Infrared Supercontinuum Generation

24. Solid Tellurite Optical Fiber Based on Stack-and-Draw Method for Efficient Mid-Infrared Supercontinuum Generation

27. Processing and characteristics of transparent Gd3TaO7 polycrystalline ceramics.

33. Spectroscopic ellipsometry from the vacuum ultraviolet to the far infrared.

37. Variable angle spectroscopic ellipsometry in the vacuum ultraviolet

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