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Microstructure and magnetic properties of BiMnO3 and BiFe0.5Mn0.5O3 films, prepared by rf magnetron sputtering on LaAlO3 (001) single-crystalline substrate, are investigated. The selected-area electron diffraction analysis allows us to identify the crystal structure of the BiMnO3 film as orthorhombic, while the BiFe0.5Mn0.5O3 film has a hexagonal lattice symmetry. High-resolution electron microscopy study reveals the presence of strip-domain phase with a periodic spacing of about 3c in both films. Magnetic measurements show that in addition to the basic paramagnetic phase the films exhibit Griffiths phase behavior in a wide temperature range. We argue that the observed weak ferromagnetism is due to the strip-domain layered inclusions, rather than intrinsic physical origin of the films., Applied Sciences

Microstructure and magnetic properties of BiMnO3 and BiFe0.5Mn0.5O3 films, prepared by rf magnetron sputtering on LaAlO3 (001) single-crystalline substrate, are investigated. The selected-area electron diffraction analysis allows us to identify the crystal structure of the BiMnO3 film as orthorhombic, while the BiFe0.5Mn0.5O3 film has a hexagonal lattice symmetry. High-resolution electron microscopy study reveals the presence of strip-domain phase with a periodic spacing of about 3c in both films. Magnetic measurements show that in addition to the basic paramagnetic phase the films exhibit Griffiths phase behavior in a wide temperature range. We argue that the observed weak ferromagnetism is due to the strip-domain layered inclusions, rather than intrinsic physical origin of the films., Applied Sciences

Nd0.52Sr0.48MnO3 films have been fabricated by dc magnetron sputtering on single-crystal LaAlO3 (001) and SrTiO3 (011) substrates with additional annealing to relax the lattice strain. Although the Nd0.52Sr0.48MnO3 films were deposited simultaneously on different substrates at the same deposition rate, they differ in thickness by a factor of ? . The observed difference in thickness is explained by the two-dimensional (layer-by-layer) film growth, rather than by a difference in growth rate controlled by the crystalline orientation of the substrate. An analysis of optical and transport properties reveals that the observed anisotropy in the polaron motion is governed by a strong anisotropy in the trapping energy, rather than in polaron formation. It is shown that the deposited Nd0.52Sr0.48MnO3 films exhibit magnetic behavior typical of two-phase magnetic systems and should be regarded as an assembly of interacting magnetic clusters., Applied Sciences

X-ray diffraction analysis and high-resolution electron microscopy of BiFeO3 films prepared by dc magnetron sputtering on single-crystal LaAlO3 (001) substrates reveal that the films have a highly c-oriented orthorhombic crystalline structure. The magnetic properties of the BiFeO3 films are typical of ensembles of interacting superparamagnetic clusters, rather than Dzyaloshinskii-Moriya weak ferromagnets. The appearance of extrinsic nanoscale superparamagnetic clusters is explained by an oxygen deficiency in certain regions of the film, where ferromagnetic ordering can be realized through a double-exchange Zener mechanism., Applied Sciences

Nd0.52Sr0.48MnO3 films of various thicknesses have been prepared by dc magnetron sputtering on single crystal LaAlO3 (001) substrates. Reducing the film thickness leads to a significant suppression of ferromagnetic (FM) ordering and the Curie point falls below the antiferromagnetic (AFM) transition temperature. When this occurs, a huge rise of the magnetoresistance ratio from 400 to 60?000% is observed in an applied magnetic field of 5 T. We surmise that this new kind of the enhanced colossal magnetoresistance effect originates in the FM/AFM competition and the collapse of the charge-ordered state at high magnetic fields, rather than in the regular double-exchange mechanism., Applied Sciences

Nd0.52Sr0.48MnO3 films have been fabricated by dc magnetron sputtering on single-crystal LaAlO3 (001) and SrTiO3 (011) substrates with additional annealing to relax the lattice strain. Although the Nd0.52Sr0.48MnO3 films were deposited simultaneously on different substrates at the same deposition rate, they differ in thickness by a factor of ? . The observed difference in thickness is explained by the two-dimensional (layer-by-layer) film growth, rather than by a difference in growth rate controlled by the crystalline orientation of the substrate. An analysis of optical and transport properties reveals that the observed anisotropy in the polaron motion is governed by a strong anisotropy in the trapping energy, rather than in polaron formation. It is shown that the deposited Nd0.52Sr0.48MnO3 films exhibit magnetic behavior typical of two-phase magnetic systems and should be regarded as an assembly of interacting magnetic clusters., Applied Sciences

Nd0.52Sr0.48MnO3 films of various thicknesses have been prepared by dc magnetron sputtering on single crystal LaAlO3 (001) substrates. Reducing the film thickness leads to a significant suppression of ferromagnetic (FM) ordering and the Curie point falls below the antiferromagnetic (AFM) transition temperature. When this occurs, a huge rise of the magnetoresistance ratio from 400 to 60?000% is observed in an applied magnetic field of 5 T. We surmise that this new kind of the enhanced colossal magnetoresistance effect originates in the FM/AFM competition and the collapse of the charge-ordered state at high magnetic fields, rather than in the regular double-exchange mechanism., Applied Sciences

X-ray diffraction analysis and high-resolution electron microscopy of BiFeO3 films prepared by dc magnetron sputtering on single-crystal LaAlO3 (001) substrates reveal that the films have a highly c-oriented orthorhombic crystalline structure. The magnetic properties of the BiFeO3 films are typical of ensembles of interacting superparamagnetic clusters, rather than Dzyaloshinskii-Moriya weak ferromagnets. The appearance of extrinsic nanoscale superparamagnetic clusters is explained by an oxygen deficiency in certain regions of the film, where ferromagnetic ordering can be realized through a double-exchange Zener mechanism., Applied Sciences

We report positron depth-profiling studies on the hydrogen sorption behavior and phase evolution of Mg-based thin films. We show that the main changes in the depth profiles resulting from the hydrogenation to the respective metal hydrides are related to a clear broadening in the observed electron momentum densities in both Mg and Mg2Ni films. This shows that positron annihilation methods are capable of monitoring these metal-to-insulator transitions, which form the basis for important applications of these types of films in switchable mirror devices and hydrogen sensors in a depth-sensitive manner. Besides, some of the positrons trap at the boundaries of columnar grains in the otherwise nearly vacancy-free Mg films. The combination of positron annihilation and x-ray diffraction further shows that hydrogen loading at elevated temperatures, in the range of 480–600 K, leads to a clear Pd–Mg alloy formation of the Pd catalyst cap layer. At the highest temperatures, the hydrogenation induces a partial delamination of the ? 5?nm thin capping layer, as sensitively monitored by positron depth profiling of the fraction of ortho-positronium formed at interface with the cap layer. The delamination effectively blocks the hydrogen cycling. In Mg–Si bilayers, we investigated the reactivity upon hydrogen loading and heat treatments near 480 K, which shows that Mg2Si formation is fast relative to MgH2. The combination of positron depth profiling and transmission electron microscopy shows that hydrogenation promotes a complete conversion to Mg2Si for this destabilized metal hydride system, while a partially unreacted, Mg-rich amorphous prelayer remains on top of Mg2Si after a single heat treatment in an inert gas environment. Thin film studies indicate that the difficulty of rehydrogenation of Mg2Si is not primarily the result from slow hydrogen dissociation at surfaces, but is likely hindered by the presence of a barrier for removal of Mg from the readily formed Mg2Si., Radiation, Radionuclides and Reactors, Applied Sciences

We report positron depth-profiling studies on the hydrogen sorption behavior and phase evolution of Mg-based thin films. We show that the main changes in the depth profiles resulting from the hydrogenation to the respective metal hydrides are related to a clear broadening in the observed electron momentum densities in both Mg and Mg2Ni films. This shows that positron annihilation methods are capable of monitoring these metal-to-insulator transitions, which form the basis for important applications of these types of films in switchable mirror devices and hydrogen sensors in a depth-sensitive manner. Besides, some of the positrons trap at the boundaries of columnar grains in the otherwise nearly vacancy-free Mg films. The combination of positron annihilation and x-ray diffraction further shows that hydrogen loading at elevated temperatures, in the range of 480–600 K, leads to a clear Pd–Mg alloy formation of the Pd catalyst cap layer. At the highest temperatures, the hydrogenation induces a partial delamination of the ? 5?nm thin capping layer, as sensitively monitored by positron depth profiling of the fraction of ortho-positronium formed at interface with the cap layer. The delamination effectively blocks the hydrogen cycling. In Mg–Si bilayers, we investigated the reactivity upon hydrogen loading and heat treatments near 480 K, which shows that Mg2Si formation is fast relative to MgH2. The combination of positron depth profiling and transmission electron microscopy shows that hydrogenation promotes a complete conversion to Mg2Si for this destabilized metal hydride system, while a partially unreacted, Mg-rich amorphous prelayer remains on top of Mg2Si after a single heat treatment in an inert gas environment. Thin film studies indicate that the difficulty of rehydrogenation of Mg2Si is not primarily the result from slow hydrogen dissociation at surfaces, but is likely hindered by the presence of a barrier for removal of Mg from the readily formed Mg2Si., Radiation, Radionuclides and Reactors, Applied Sciences

The microstructural and magnetic properties of amorphous, nanoclustered, and self-organized bilayer Nd0.5Sr0.5MnO3 films, prepared by rf magnetron sputtering, are investigated. The amorphous film was found to be a typical paramagnet with free motion of the individual Mn spins, and the magnetic properties are well described on the basis of the Curie–Weiss approximation. The nanoclustered film manifests magnetic properties mimicking those of superparamagnetic particles following nonclassical magnetic dynamics. The self-organized bilayer film demonstrates a negative exchange bias typical of a ferromagnet/antiferromagnet hybrid system, in spite of the fact that both layers have a ferromagnetic origin. The magnetic properties of the films are discussed in detail on the basis of modern theoretical models., Applied Sciences

The microstructural and magnetic properties of amorphous, nanoclustered, and self-organized bilayer Nd0.5Sr0.5MnO3 films, prepared by rf magnetron sputtering, are investigated. The amorphous film was found to be a typical paramagnet with free motion of the individual Mn spins, and the magnetic properties are well described on the basis of the Curie–Weiss approximation. The nanoclustered film manifests magnetic properties mimicking those of superparamagnetic particles following nonclassical magnetic dynamics. The self-organized bilayer film demonstrates a negative exchange bias typical of a ferromagnet/antiferromagnet hybrid system, in spite of the fact that both layers have a ferromagnetic origin. The magnetic properties of the films are discussed in detail on the basis of modern theoretical models., Applied Sciences