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1. Laser Speckle Photometry for Inline Defect Detection in Solder Connections of Power Electronics.

Author

Surner, Lennard, Chen, Lili, Bendjus, Beatrice, Gerlach, Gerald, and Schuh, Jannis

Subjects
SPECKLE interference, MANUFACTURING processes, SURFACE states, SUBSTRATES (Materials science), COMPUTER performance
Abstract

Copyright of Technisches Messen is the property of De Gruyter and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Published
2024
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