417 results on '"Suñé J"'
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2. Modeling and simulation of successive breakdown events in thin gate dielectrics using standard reliability growth models
3. SPICE model for complementary resistive switching devices based on anti-serially connected quasi-static memdiodes
4. A simple, robust, and accurate compact model for a wide variety of complementary resistive switching devices
5. Application of artificial neural networks to the identification of weak electrical regions in large area MIM structures
6. Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model
7. Impact of the forming and cycling processes on the electrical and physical degradation characteristics of HfO2-based resistive switching devices
8. The Role of the Programming Trajectory in the Power Dissipation Dynamics and Energy Consumption of Memristive Devices
9. Simple method for monitoring the switching activity in memristive cross-point arrays with line resistance effects
10. Detection of inhibitory effects in the generation of breakdown spots in HfO2-based MIM devices
11. SPICE model for the current-voltage characteristic of resistive switching devices including the snapback effect
12. Simulation of Bipolar-Type Resistive Switching Devices Using a Recursive Approach to the Dynamic Memdiode Model
13. A simple drain current model for Schottky-barrier carbon nanotube field effect transistors
14. A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
15. Characterization of HfO2-based devices with indication of second order memristor effects
16. Simulation of the effect of material properties on yttrium oxide memristor-based artificial neural networks
17. Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis
18. Effect of the voltage ramp rate on the set and reset voltages of ReRAM devices
19. Spatial analysis of failure sites in large area MIM capacitors using wavelets
20. Modeling and simulation of successive breakdown events in thin gate dielectrics using standard reliability growth models
21. SPICE Simulation of Quantum Transport in Al2O3/HfO2-Based Antifuse Memory Cells
22. Breakdown time statistics of successive failure events in constant voltage-stressed Al2O3/HfO2 nanolaminates
23. Resistive switching in CeO2/La0.8Sr0.2MnO3 bilayer for non-volatile memory applications
24. Temperature and polarity dependence of the switching behavior of Ni/HfO2-based RRAM devices
25. An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs
26. Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates
27. Modeling of the output characteristics of advanced n-MOSFETs after a severe gate-to-channel dielectric breakdown
28. Effect of an ultrathin SiO2 interfacial layer on the hysteretic current–voltage characteristics of CeOx-based metal–insulator–metal structures
29. Modeling the breakdown statistics of Al2O3/HfO2 nanolaminates grown by atomic-layer-deposition
30. Degradation and breakdown characteristics of Al/HfYOx/GaAs capacitors
31. Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
32. Initial leakage current related to extrinsic breakdown in HfO 2/Al 2O 3 nanolaminate ALD dielectrics
33. Exploratory study and application of the angular wavelet analysis for assessing the spatial distribution of breakdown spots in Pt/HfO2/Pt structures.
34. Changes in COPD-related anxiety symptoms during pulmonary rehabilitation: a prospective quantitative and qualitative study
35. Boundary conditions with Pauli exclusion and charge neutrality: application to the Monte Carlo simulation of ballistic nanoscale devices
36. Monte Carlo simulations of nanometric devices beyond the “mean-field” approximation
37. Eigenstate fitting in the k · p method
38. A physics-based deconstruction of the percolation model of oxide breakdown
39. Modeling of the multilevel conduction characteristics and fatigue profile of Ag/La1/3Ca2/3MnO3/Pt structures using a compact memristive approach.
40. Evaluation of the Degradation Dynamics of Thin Silicon Dioxide Films using Model-Independent Procedures
41. Improving Electron Transport Simulation in Mesoscopic Systems by Coupling a Classical Monte Carlo Algorithm to a Wigner Function Solver
42. Simulation of Mesoscopic Devices with Bohm Trajectories and Wavepackets
43. Applying the Integrated Sustainability Framework to explore the long-term sustainability of nutrition education programmes in schools: a systematic review
44. Critical evaluation of hard-breakdown based reliability methodologies for ultrathin gate oxides
45. Search for dark photons with the FASER detector at the LHC
46. Statistics of soft and hard breakdown in thin SiO 2 gate oxides
47. Critical reliability challenges in scaling SiO 2-based dielectric to its limit
48. Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes
49. Simulation of thermal reset transitions in resistive switching memories including quantum effects.
50. Assessing the spatial correlation and conduction state of breakdown spot patterns in Pt/HfO2/Pt structures using transient infrared thermography.
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