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2. Null Holographic Test Structures for the Measurement of Overlay and Its Statistical Variation

13. Extraction of Sheet Resistance and Line Width From All-Copper ECD Test Structures Fabricated From Silicon Preforms

19. CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

21. Prototype detector technology for the SCUBA-2 submillimetre bolometer array

25. Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics.

27. Development of a miniaturised drug delivery system with wireless power transfer and communication.

28. Test Chip for the Development and Evaluation of Sensors for Measuring Stress in Metal Interconnects.

29. On-Mask CD and Overlay Test Structures for Alternating Aperture Phase Shift Lithography.

40. Integration of IC technology with MEMS

46. Implementation of wireless power transfer and communications for an implantable ocular drug delivery system.

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