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The operating principle of resistive random access memories (RRAMs) relies on the distribution of ionic species and their influence on the electron transport. Taking into account that formation and annihilation of conducting filaments (CFs) is the driving mechanism for the switching effect, it is very important to control the regions where these filaments will evolve. Thus, homolayers of titanium oxide with different oxygen contents were fabricated in order to tune the local electrical and thermal properties of the CFs and narrow down the potential percolation paths. We show that the oxygen content in the top layer of the TiO2-x/TiO2-y bilayer memristors can directly influence the morphology of the layers which affect the diffusion barrier and consequently the diffusivity and drift velocity of oxygen vacancies, yielding in important enhancement of switching characteristics, in terms of spatial uniformity (σ/μ<0.2), enlarged switching ratio (~104), and synaptic learning. In order to address the experimental data, a physical model was applied, divulging the crucial role of temperature, electric potential and oxygen vacancy density on the switching effect and offering physical insights to the SET/RESET transitions and the analog switching. The forming free nature of all the devices in conjunction with the self-rectifying behavior, should also be regarded as important assets towards RRAM device optimization. [ABSTRACT FROM AUTHOR]

In this work, we present the results obtained using a CO2 laser source at 10.6 µm wavelength for the study of the non-melt annealing of phosphorus doped germanium in the millisecond regime. Main objective of this paper is the demonstration of electrically active n+-p junctions in germanium by implanting phosphorus in p-type substrate while trying to maintain minimal dopant diffusion, which is a critical issue for scaling germanium devices. In addition to the phosphorus diffusion studies, we also explore the presence of nitrogen introduced in the substrate together with phosphorus and we conclude that it can further reduce dopant movement at the expense of lower activation level. The observation is confirmed by both electrical and SIMS measurements. Moreover, density functional theory calculations show that nitrogen-phosphorus co-doping of germanium creates stable N-P complexes that, indeed, are consistent with the deactivation and diffusion suppression of phosphorus. [ABSTRACT FROM AUTHOR]

Resistive random access memories (RRAMs) are considered as key enabling components for a variety of emerging applications due to their capacity to support multiple resistive states. Deciphering the underlying mechanisms that support resistive switching remains to date a topic of debate, particularly for metal-oxide technologies, and is very much needed for optimizing their performance. This work aims to identify the dominant conduction mechanisms during switching operation of Pt/TiO2-x/Pt stacks, which is without a doubt one of the most celebrated ones. A number of identical devices were accordingly electroformed for acquiring distinct resistive levels through a pulsing-based and compliance-free protocol. For each obtained level, the switching current-voltage (I-V) characteristics were recorded and analyzed in the temperature range of 300 K–350 K. This allowed the extraction of the corresponding signature plots revealing the dominant transport mechanism for each of the I-V branches. Gradual (analogue) switching was obtained for all cases, and two major regimes were identified. For the higher resistance regime, the transport at both the high and low resistive states was found to be interface controlled due to Schottky emission. As the resistance of devices reduces to lower levels, the dominant conduction changes from an interface to the core-material controlled mechanism. This study overall supports that engineering the metal-oxide/metal electrode interface can lead to tailored barrier modifications for controlling the switching characteristics of TiO2 RRAM. [ABSTRACT FROM AUTHOR]

Abstract: The design and implementation of a chemi-resistor sensor utilizing platinum nanoparticles and a poly(2-hydroxyethyl methacrylate) (PHEMA) polymer layer is presented. The sensor was fabricated utilizing a magnetron sputtering system for the gas phase synthesis of metallic nanoparticles and an ink-jet printer for the PHEMA polymer delivery. The platinum nanoparticles have been deposited on oxidized silicon substrates which have been previously patterned with gold interdigitated electrodes. Following the nanoparticles deposition a PHEMA polymer layer has been delivered on top, using the ink-jet printing technique. By controlling the density of the metal nanoparticle film, sensors of different sensitivity can be fabricated. [Copyright &y& Elsevier]

Resistive random access memories (RRAMs) can be programmed to discrete resistive levels on demand via voltage pulses with appropriate amplitude and widths. This tuneability enables the design of various emerging concepts, to name a few: neuromorphic applications and reconfigurable circuits. Despite the wide interest in RRAM technologies there is still room for improvement and the key lies with understanding better the underpinning mechanism responsible for resistive switching. This work presents a methodology that aids such efforts, by revealing the nature of the resistive switching through assessing the transport properties in the non-switching operation regimes, before and after switching occurs. Variation in the transport properties obtained by analysing the current-voltage characteristics at distinct temperatures provides experimental evidence for understanding the nature of the responsible mechanism. This study is performed on prototyped device stacks that possess common Au bottom electrodes, identical TiO2 active layers while employing three different top electrodes, Au, Ni and Pt. Our results support in all cases an interface controlled transport due to Schottky emission and suggest that the acquired gradual switching originates by the bias induced modification of the interfacial barrier. Throughout this study, the top electrode material was found to play a role in determining the electroforming requirements and thus indirectly the devices' memristive characteristics whilst both the top and bottom metal/oxide interfaces are found to be modified as result of this process. [ABSTRACT FROM AUTHOR]

Implantable devices hold the potential to address conditions currently lacking effective treatments, such as drug-resistant neural impairments and prosthetic control. Medical devices need to be biologically compatible while providing enhanced performance metrics of low-power consumption, high accuracy, small size, and minimal latency to enable ongoing intervention in brain function. Here, we demonstrate a memristor-based processing system for single-trial detection of behaviorally meaningful brain signals within a timeframe that supports real-time closed-loop intervention. We record neural activity from the reward center of the brain, the ventral tegmental area, in rats trained to associate a musical tone with a reward, and we use the memristors built-in thresholding properties to detect nontrivial biomarkers in local field potentials. This approach yields consistent and accurate detection of biomarkers >98% while maintaining power consumption as low as 4.14 nanowatt per channel. The efficacy of our system's capabilities to process real-time in vivo neural data paves the way for low-power chronic neural activity monitoring and biomedical implants.

Brain-inspired resistive random-access memory (RRAM) technology is anticipated to outperform conventional flash memory technology due to its performance, high aerial density, low power consumption, and cost. For RRAM devices, metal oxides are exceedingly investigated as resistive switching (RS) materials. Among different oxides, tin oxide (SnO x ) received minimal attention, although it possesses excellent electronic properties. Herein, we demonstrate compliance-free, analog resistive switching behavior with several stable states in Ti/Pt/SnO x /Pt RRAM devices. The compliance-free nature might be due to the high internal resistance of SnO x films. The resistance of the films was modulated by varying Ar/O 2 ratio during the sputtering process. The I-V characteristics revealed a well-expressed high resistance state (HRS) and low resistance states (LRS) with bipolar memristive switching mechanism. By varying the pulse amplitude and width, different resistance states have been achieved, indicating the analog switching characteristics of the device. Furthermore, the devices show excellent retention for eleven states over 1000 s with an endurance of > 100 cycles., (© 2024. The Author(s).)

Electronic systems are becoming more and more ubiquitous as our world digitises. Simultaneously, even basic components are experiencing a wave of improvements with new transistors, memristors, voltage/current references, data converters, etc, being designed every year by hundreds of R &D groups world-wide. To date, the workhorse for testing all these designs has been a suite of lab instruments including oscilloscopes and signal generators, to mention the most popular. However, as components become more complex and pin numbers soar, the need for more parallel and versatile testing tools also becomes more pressing. In this work, we describe and benchmark an FPGA system developed that addresses this need. This general purpose testing system features a 64-channel source-meter unit, and [Formula: see text] banks of 32 digital pins for digital I/O. We demonstrate that this bench-top system can obtain [Formula: see text] current noise floor, [Formula: see text] pulse delivery at [Formula: see text] and [Formula: see text] maximum current drive/channel. We then showcase the instrument's use in performing a selection of three characteristic measurement tasks: (a) current-voltage characterisation of a diode and a transistor, (b) fully parallel read-out of a memristor crossbar array and (c) an integral non-linearity test on a DAC. This work introduces a down-scaled electronics laboratory packaged in a single instrument which provides a shift towards more affordable, reliable, compact and multi-functional instrumentation for emerging electronic technologies., (© 2022. The Author(s).)

Biological synapses store multiple memories on top of each other in a palimpsest fashion and at different time scales. Palimpsest consolidation is facilitated by the interaction of hidden biochemical processes governing synaptic efficacy during varying lifetimes. This arrangement allows idle memories to be temporarily overwritten without being forgotten, while previously unseen memories are used in the short term. While embedded artificial intelligence can greatly benefit from this functionality, a practical demonstration in hardware is missing. Here, we show how the intrinsic properties of metal-oxide volatile memristors emulate the processes supporting biological palimpsest consolidation. Our memristive synapses exhibit an expanded doubled capacity and protect a consolidated memory while up to hundreds of uncorrelated short-term memories temporarily overwrite it, without requiring specialized instructions. We further demonstrate this technology in the context of visual working memory. This showcases how emerging memory technologies can efficiently expand the capabilities of artificial intelligence hardware toward more generalized learning memories.

Memristors, when utilized as electronic components in circuits, can offer opportunities for the implementation of novel reconfigurable electronics. While they have been used in large arrays, studies in ensembles of devices are comparatively limited. Here we propose a vertically stacked memristor configuration with a shared middle electrode. We study the compound resistive states presented by the combined in-series devices and we alter them either by controlling each device separately, or by altering the full configuration, which depends on selective usage of the middle floating electrode. The shared middle electrode enables a rare look into the combined system, which is not normally available in vertically stacked devices. In the course of this study, it was found that separate switching of individual devices carries over its effects to the Complete device (albeit non-linearly), enabling increased resistive state range, which leads to a larger number of distinguishable states (above SNR variance limits) and hence enhanced device memory. Additionally, by applying a switching stimulus to the external electrodes it is possible to switch both devices simultaneously, making the entire configuration a voltage divider with individual memristive components. Through usage of this type of configuration and by taking advantage of the voltage division, it is possible to surge-protect fragile devices, while it was also found that simultaneous reset of stacked devices is possible, significantly reducing the required reset time in larger arrays., (© 2022. The Author(s).)

Over the past decade, memristors have been extensively studied for a number of applications, almost exclusively with DC characterization techniques. Studies of memristors in AC circuits are sparse, with only a few examples found in the literature, and characterization methods with an AC input are also sparingly used. However, publications concerning the usage of memristors in this working regime are currently on the rise. Here we propose a "technology agnostic" methodology for memristor testing in certain frequency bands. A measurement process is initially proposed, with specific instructions on sample preparation, followed by an equipment calibration and measurement protocol. This article is structured in a way which aims to facilitate the usage of any available measurement equipment and it can be applied on any type of memristive technology. The second half of this work is centered around the representation of data received from following this process. Bode plot and Nyquist plot representations are considered and the information received from them is evaluated. Finally, examples of expected behaviors are given, characterizing simulated scenarios which represent different internal device models and different switching behaviors, such as capacitive or inductive switching. This study aims at providing a cohesive way for memristor characterization, to be used as a good starting point for frequency applications, and for understanding physical processes inside the devices, by streamlining the measuring process and providing a frame in which data representation and comparison will be facilitated., (© 2021. The Author(s).)

There is an increasing interest for alternative ways to program memristive devices to arbitrary resistive levels. Among them, light-controlled programming approach, where optical input is used to improve or to promote the resistive switching, has drawn particular attention. Here, we present a straight-forward method to induce resistive switching to a memristive device, introducing a new version of a metal-oxide memristive architecture coupled with a UV-sensitive hybrid top electrode obtained through direct surface treatment with PEDOT:PSS of an established resistive random access memory platform. UV-illumination ultimately results to resistive switching, without involving any additional stimulation, and a relation between the switching magnitude and the applied wavelength is depicted. Overall, the system and method presented showcase a promising proof-of-concept for granting an exclusively light-triggered resistive switching to memristive devices irrespectively of the structure and materials comprising their main core, and, in perspective can be considered for functional integrations optical-induced sensing.