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3. Kristallstrukturanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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4. Zellparameterbestimmung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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5. Hardware für die Röntgenbeugung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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6. Methoden der Röntgenbeugung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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7. Phasenanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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9. Einleitung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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10. Lösung der Aufgaben

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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12. Beugung von Röntgenstrahlung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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13. Komplexe Anwendung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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14. Spezielle Verfahren

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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15. Bestimmung der Kristallorientierung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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16. Untersuchungen an dünnen Schichten

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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17. Röntgenographische Texturanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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18. Röntgenographische Spannungsanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2019
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19. Effect of Carbon Content on the Phase Composition, Microstructure and Mechanical Properties of the TiC Layer Formed in Hot-Pressed Titanium-Steel Composites.

Author

Grad, Marius, Zentgraf, Jan, Schultheiss, Ulrich, Esper, Lukas, Diemar, Andreas, Noster, Ulf, and Spiess, Lothar

Subjects
GLOW discharges, YOUNG'S modulus, RESPONSE surfaces (Statistics), EMISSION spectroscopy, HOT pressing
Abstract

During the hot pressing of pure titanium and different carbon steels in a temperature range of ϑ = 950–1050 ° C , a compound layer up to dL≈10 μ m thick is formed at the titanium–steel interface. With a higher carbon content of the used steel, the layer thickness increases. The carbon concentration within the layer is in the range of stoichiometry for TiC. Apart from TiC, no other phases can be detected by X-ray diffraction (XRD) measurements inside the formed layer. The calculation of the activation energy for the TiC layer formation is Q = 126.5–136.7 kJ mol−1 and is independent of the carbon content of the steel. The resulting microstructure has a grain size gradient, wherein the mechanical properties, such as hardness and Young's modulus, are almost constant. Statistical analysis using Response Surface Methodology (RSM) indicates that the carbon content of the steel has the most significant influence on layer thickness, followed by annealing temperature and annealing time. By selecting the appropriate carbon steel and the subsequent removal of the steel, it is possible to produce targeted TiC layers on titanium substrates, which holds enormous potential for this material in wear-intensive applications. [ABSTRACT FROM AUTHOR]

Published
2024
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25. Kristallstrukturanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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26. Phasenanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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27. Methoden der Röntgenbeugung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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28. Einleitung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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29. Lösung der Aufgaben

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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30. Hardware für die Röntgenbeugung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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31. Beugung von Röntgenstrahlung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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33. Bestimmung der Kristallorientierung

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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34. Untersuchungen an dünnen Schichten

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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35. Röntgenographische Texturanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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36. Spezielle Verfahren

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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37. Röntgenographische Spannungsanalyse

Author

Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, Genzel, Christoph, Spieß, Lothar, Teichert, Gerd, Schwarzer, Robert, Behnken, Herfried, and Genzel, Christoph

Published
2009
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38. Moderne Röntgenbeugung

Author

Spieß, Lothar, primary, Teichert, Gerd, additional, Schwarzer, Robert, additional, Behnken, Herfried, additional, and Genzel, Christoph, additional

Published
2019
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39. Kristallstrukturanalyse

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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41. Gitterkonstantenbestimmung

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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43. Phasenanalyse

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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45. Methoden der Röntgenbeugung

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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46. Einleitung

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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49. Lösung der Aufgaben

Author

Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, Teichert, Gerd, Spieß, Lothar, Schwarzer, Robert, Behnken, Herfried, and Teichert, Gerd

Published
2005
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