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Objectives/Interrogation: Acute dislocation of the thumb carpometacarpal (CMC) joint is a rare, high-energy injury because of the strong capsulo-ligamentous complex structure. There are a few reports of this injury in the literature, and its optimal treatment remains controversial. This study aimed[for full text, please go to the a.m. URL], 14th Triennial Congress of the International Federation of Societies for Surgery of the Hand (IFSSH), 11th Triennial Congress of the International Federation of Societies for Hand Therapy (IFSHT), 11th Triennial Congress of the International Federation of Societies for Hand Therapy (IFSHT)

28th European Photovoltaic Solar Energy Conference and Exhibition; 3159-3162, We investigated technologies for rapidly and accurately determining the I-V curves of high-capacity crystalline silicon (c-Si) solar cells. The I-V curves of these types of c-Si solar cells, such as those with an a-Si/c-Si heterojunction structure, are dependent on the voltage sweep time and direction up to a sweep time of several hundred milliseconds. The results of the present study show that the sweep time needed for measuring more recentlydeveloped high-efficiency devices are longer than for older devices, possibly due to their higher capacitance, especially at higher bias voltages. They have also shown the type of I-V testers employed to be an important factor. The sweep time required for accurately measuring I-V curves varies according to the I-V tester being used and is affected by the tester’s individual electrical impedance and control logic. We have developed novel technology for IV testers that involves measuring high-capacity c-Si solar cells and modules using a short pulse of light. It provides the advantage of not requiring fine voltage control or real-time feedback. I-V curves of high-efficiency a-Si/c-Si heterojunction solar cells and modules measured using this novel I-V tester, which applies a single 20 - 50 msec flash of light, have shown very good agreement, typically within 0.3%, with the results measured at AIST under continuous or long-pulse (0.5 - 1 sec.) illumination.

23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain; 2974-2977, The importance of uniformity measurements of solar simulator light has become more significant than before, as the module size has become bigger, and also as the requirement for the measurement accuracy has become more precise. In this study, a digital camera-based novel technology for accurately measuring the solar simulator uniformity is presented, and its usefulness is demonstrated. The method of the present study is based on photographing the distribution of the solar simulator light, which is projected on a screen. The digital data of the photograph are converted into irradiance by considering the characteristics of the camera and the screen, such as the uniformity and linearity, etc. It has advantage over the conventional method that the measurement is quick (order of millisecond or faster). Therefore, the same setup is applicable to both pulsed and continuous solar simulators. One flash of pulsed simulator is enough for the uniformity measurement. Also, the spatial resolution is high, enabling the uniformity data of many points (hundreds or more) measured by one shot. The measured uniformity data are applicable to various kinds of PV modules such as c-Si modules and integrated thin-film modules. Preliminary experiments have shown that the present method of uniformity measurement typically agrees with the conventional method within ~ 0.4% or better, which can be used for measuring, monitoring, and adjusting the solar simulator uniformity. Typical procedure of the measurement and the requirements for the hardware and software are also discussed.