217 results on '"Shard, Alexander G."'
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2. Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy.
3. Practical guides for x-ray photoelectron spectroscopy: Use of argon ion beams for sputter depth profiling and cleaning.
4. Importance of standard terminology in surface chemical analysis: ISO 18115‐1:2023, general terms and terms used in spectroscopy
5. Quantitative and Qualitative Analyses of Mass Spectra of OEL Materials by Artificial Neural Network and Interface Evaluation: Results from a VAMAS Interlaboratory Study
6. Measurement of Peptide Coating Thickness and Chemical Composition Using XPS
7. Introduction
8. Contributors
9. X-ray photoelectron spectroscopy
10. Conclusions and perspectives
11. Ultraviolet–visible spectrophotometry
12. Protein identification by 3D OrbiSIMS to facilitate in situ imaging and depth profiling
13. Cryo-XPS for Surface Characterization of Nanomedicines.
14. The matrix effect in organic secondary ion mass spectrometry
15. Surface Analysis of Pristine and Cycled NMC/Graphite Lithium-Ion Battery Electrodes: Addressing the Measurement Challenges
16. Erratum: Correction to “Quantification of hard X‐ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5‐ to 10‐keV photons in any instrument geometry”
17. Molecular Formula Prediction for Chemical Filtering of 3D OrbiSIMS Datasets
18. Ionic liquid [PMIM]+[NTf2]− (Solarpur®) characterized by XPS
19. Quantifiable correlation of ToF‐SIMS and XPS data from polymer surfaces with controlled amino acid and peptide content
20. Quantification of hard X‐ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5‐ to 10‐keV photons in any instrument geometry
21. Versailles project on advanced materials and standards (VAMAS) interlaboratory study on measuring the number concentration of colloidal gold nanoparticles
22. In situ methods: discoveries and challenges: general discussion
23. A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects
24. Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics
25. Summary of ISO/TC 201 Technical Report 23173—Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings
26. Quantitative XPS depth profiling of codeine loaded poly( l-lactic acid) films using a coronene ion sputter source
27. C 60 ion sputtering of layered organic materials
28. Chapter 4.3.1 - X-ray photoelectron spectroscopy
29. Chapter 3.2.3 - Ultraviolet–visible spectrophotometry
30. Chapter 6 - Conclusions and perspectives
31. Chapter 1 - Introduction
32. A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects.
33. Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis
34. Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry
35. ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]
36. Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
37. Al Kα XPS reference spectra of polyethylene for all instrument geometries
38. Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles
39. Ionic liquid [PMIM]+[NTf2]− (Solarpur®) characterized by XPS.
40. Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS
41. Surface-Energy Control and Characterization of Nanoparticle Coatings
42. Role of consistent terminology in XPS reproducibility
43. In situ protein identification and mapping using secondary ion mass spectrometry
44. Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source
45. Low-energy ion scattering (LEIS)
46. Biocompatibility and the efficacy of medical implants
47. Correction: Schavkan, A., et al. Number Concentration of Gold Nanoparticles in Suspension: SAXS and spICPMS as Traceable Methods Compared to Laboratory Methods. Nanomaterials 2019, 9, 502
48. Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials
49. Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources
50. Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
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