135 results on '"Seoane, Natalia"'
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2. An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs
3. A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET
4. Parallel approach of Schrödinger-based quantum corrections for ultrascaled semiconductor devices
5. Numerical optimisation and recombination effects on the vertical-tunnel-junction (VTJ) GaAs solar cell up to 10,000 suns
6. Improving the performance of photovoltaic laser power converters using automatic global optimization techniques
7. A general toolkit for advanced semiconductor transistors: from simulation to machine learning
8. Scaling/LER study of Si GAA nanowire FET using 3D finite element Monte Carlo simulations
9. An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs
10. Photogeneration and Performance Optimization (PhPO): A new algorithm to improve the performance of Vertical Epitaxial Hetero-Structure Architecture laser power converters
11. An Accurate Machine Learning Model to Study the Impact of Realistic Metal Grain Granularity on Nanosheet Fets
12. Multilevel 3-D Device Simulation Approach Applied to Deeply Scaled Nanowire Field Effect Transistors
13. A machine learning approach to model the impact of line edge roughness on gate-all-around nanowire FETs while reducing the carbon footprint.
14. Analysis of Parallel Numerical Libraries to Solve the 3D Electron Continuity Equation
15. Laser Power Converter Architectures Based on 3C‐SiC with Efficiencies >80%
16. Dependence of the vertical‐tunnel‐junction GaAs solar cell on concentration and temperature
17. Band-gap material selection for remote high-power laser transmission
18. Pelgrom-Based Predictive Model to Estimate Metal Grain Granularity and Line Edge Roughness in Advanced Multigate MOSFETs
19. Parallel approach of Schrödinger-based quantum corrections for ultrascaled semiconductor devices
20. GaAs Vertical-Tunnel-Junction Converter for Ultra-High Laser Power Transfer
21. Simulations of Statistical Variability in n-Type FinFET, Nanowire, and Nanosheet FETs
22. Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques
23. Current variability in Si nanowire MOSFETs due to random dopants in the source/drain regions: a fully 3-D NEGF simulation study
24. Random dopant related variability in the 30 nm gate length In0.75Ga0.25As implant free MOSFET
25. Benchmarking of scaled InGaAs implant-free nanoMOSFETs
26. Does the Threshold Voltage Extraction Method Affect Device Variability?
27. Ultra‐efficient intrinsic‐vertical‐tunnel‐junction structures for next‐generation concentrator solar cells
28. Special Issue: Nanowire Field-Effect Transistor (FET)
29. Benchmarking of FinFET, Nanosheet, and Nanowire FET Architectures for Future Technology Nodes
30. Analysis of Parallel Numerical Libraries to Solve the 3D Electron Continuity Equation
31. A Multi-Method Simulation Toolbox to Study Performance and Variability of Nanowire FETs
32. Drift-Diffusion Versus Monte Carlo Simulated ON-Current Variability in Nanowire FETs
33. Ultra‐efficient intrinsic‐vertical‐tunnel‐junction structures for next‐generation concentrator solar cells.
34. Analysis of Fluctuation Sensitivity Map Algorithms Applied to a 10nm GAA NW FET
35. Study of GaAs Vertical Solar Cells at High Concentration Levels
36. Modelling of nanoscale multi-gate transistors affected by atomistic interface roughness
37. FoMPy: A figure of merit extraction tool for semiconductor device simulations
38. Impact of Cross-Sectional Shape on 10-nm Gate Length InGaAs FinFET Performance and Variability
39. Vertical-tunnel-junction (VTJ) solar cell for ultra-high light concentrations (>2000 suns)
40. FinFET Versus Gate-All-Around Nanowire FET: Performance, Scaling, and Variability
41. Spatial Sensitivity of Silicon GAA Nanowire FETs Under Line Edge Roughness Variations
42. Metal Grain Granularity Study on a Gate-All-Around Nanowire FET
43. Fluctuation Sensitivity Map: A Novel Technique to Characterise and Predict Device Behaviour Under Metal Grain Work-Function Variability Effects
44. Vertical-Tunnel-Junction (VTJ) Solar Cell for Ultra-High Light Concentrations (>2000 Suns).
45. Comparison of Fin-Edge Roughness and Metal Grain Work Function Variability in InGaAs and Si FinFETs
46. Scaling/LER study of Si GAA nanowire FET using 3D Finite Element Monte Carlo simulations
47. Implementation of the KVM Hypervisor on Several Cloud Platforms: Tuning the Apache CloudStack Agent
48. Random Dopant, Line-Edge Roughness, and Gate Workfunction Variability in a Nano InGaAs FinFET
49. Optimisation and parallelisation of a 2D MOSFET multi-subband ensemble Monte Carlo simulator
50. Two-Dimensional Monte Carlo Simulation of DGSOI MOSFET Misalignment
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