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839 results on '"Sengupta, Arijit"'

24. Development of Thumb Endurance Curves Applicable for Deadman Switches in Sandblasting Machines

Author

Sengupta, Arijit K., Oztas, Ugur, Krake, Anthony, Kacprzyk, Janusz, Series Editor, Gomide, Fernando, Advisory Editor, Kaynak, Okyay, Advisory Editor, Liu, Derong, Advisory Editor, Pedrycz, Witold, Advisory Editor, Polycarpou, Marios M., Advisory Editor, Rudas, Imre J., Advisory Editor, Wang, Jun, Advisory Editor, Black, Nancy L., editor, Neumann, W. Patrick, editor, and Noy, Ian, editor

Published
2021
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32. Teaching Tip: Enhancing ERP Learning Outcomes through Microsoft Dynamics

Author

Zadeh, Amir H., Zolbanin, Hamed M., Sengupta, Arijit, and Schultz, Todd

Abstract

Enterprise resource planning systems (ERP) are the most essential and critical information systems that are widely used to build all the functions of a business into a unified and efficient enterprise system. Although the essence of ERP systems are easy to understand, students, especially those who do not have technical experience, have difficulty appreciating how different components of these systems interrelate and work together to improve the efficiency and effectiveness of business processes. This paper illustrates how an MIS course that incorporates Microsoft Dynamics ERP into the curriculum is designed. We demonstrate how technical aspects of ERP systems can be incorporated into ERP courses to help business students recognize the importance of technical knowledge in today's marketplace and develop technical skills in their learning process. We focus on Microsoft Dynamics AX as a unified ERP system along with its associated products and technologies (i.e., SQL, Power BI, Visual Studio, etc.) to ensure the highest level of competency. Examples of the course description, hands-on labs, exercises, and resources are provided. Results of student assessments are included, which support that hands-on learning on Microsoft Dynamics AX ERP system can lead to improved learning outcomes, both functionally and technically.

Published
2020

48. Single-Event Effects in Heavy-Ion Irradiated 3-kV SiC Charge-Balanced Power Devices

Author

Sengupta, Arijit, Ball, Dennis R., Islam, Sajal, Senarath, Aditha S., Sternberg, Andrew L., Zhang, En Xia, Alles, Michael L., Osheroff, Jason M., Ghandi, Reza, Jacob, Biju, Goswami, Shubhodeep, Hitchcock, Collin W., Hutson, John M., Reed, Robert A., Galloway, Kenneth F., Schrimpf, Ronald D., and Witulski, Arthur F.

Abstract

Experimental heavy-ion responses of 3-kV charge-balanced (CB) SiC power devices are compared with those of 3.3-kV planar SiC devices. The devices are similar, except the epitaxial region of the CB devices is heavily doped compared with the planar devices. The higher doping in the epitaxial region results in loweron-resistance, but typically leads to a lower threshold drain voltage at which single-event burnout (SEB) occurs. The experimental results demonstrate, however, that the CB devices have a similar SEB threshold to the planar devices due to the improved electric field distribution.

Published
2024
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