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Your search keyword '"Schneijdenberg, C.T.W.M."' showing total 7 results

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7 results on '"Schneijdenberg, C.T.W.M."'

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1. Extremely thin layer plastification for focused-ion beam scanning electron microscopy: an improved method to study cell surfaces and organelles of cultured cells

2. Repulsive van der Waals forces enable Pickering emulsions with non-touching colloids

3. Repulsive van der Waals forces enable Pickering emulsions with non-touching colloids

4. Repulsive van der Waals forces enable Pickering emulsions with non-touching colloids

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