1. Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
- Author
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Evangelista, Y., Ambrosino, F., Feroci, M., Bellutti, P., Bertuccio, G., Borghi, G., Campana, R., Caselle, M., Cirrincione, D., Ficorella, F., Fiorini, M., Fuschino, F., Gandola, M., Grassi, M., Labanti, C., Malcovati, P., Mele, F., Morbidini, A., Picciotto, A., Rachevski, A., Rashevskaya, I., Sammartini, M., Zampa, G., Zampa, N., Zorzi, N., and Vacchi, A. more...
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Astrophysics - Instrumentation and Methods for Astrophysics - Abstract
Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as focal plane devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput X-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments., Comment: Accepted for publication in Journal of Instrumentation (JINST) on 29th August 2018 more...
- Published
- 2018
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