1. Structure and stability studies of electrodeposited ?-BiO
- Author
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Emmanuel Roy, Michael Walls, G.Y. Wang, A. Helfen, Kui Yu-Zhang, Yamin Leprince-Wang, and S. Merkourakis
- Subjects
Diffraction ,Crystallography ,Materials science ,Transmission electron microscopy ,Annealing (metallurgy) ,General Materials Science ,Thermal stability ,General Chemistry ,Crystal structure ,Crystallite ,Thin film ,Condensed Matter Physics - Abstract
High oxide-ion conducting material δ-Bi 2 O 3 was electrodeposited on stainless steel and polycrystalline Au substrates at low temperature. Both X-ray diffraction (XRD) measurements and transmission electron microscopy (TEM) images revealed nanocrystallites about 100 nm in size inside the electrodeposited δ-Bi 2 O 3 thin films. High-resolution TEM images showed the existence of smaller nanocrystallites 10–20 nm in diameter. The long-term stability of the electrodeposited δ-Bi 2 O 3 was checked by XRD measurements on 1-year-old samples. Its thermal stability was studied through a series of annealing at different temperatures. At an annealing temperature of 340 °C, the δ-Bi 2 O 3 fcc structure begins to change towards that of Sillenite ( bcc ).
- Published
- 2005
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