1. Effect of ytterbium oxide deposition on microstructural and electrical properties of thin tantalum foil
- Author
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Ajit K. Mahapatro, S. K. Chamoli, Nidhi Puri, and Aman Rohilla
- Subjects
Materials science ,Mechanical Engineering ,Tantalum ,chemistry.chemical_element ,02 engineering and technology ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,0104 chemical sciences ,chemistry ,Mechanics of Materials ,Electrical resistivity and conductivity ,Electrode ,General Materials Science ,Thin film ,Composite material ,0210 nano-technology ,Layer (electronics) ,Ohmic contact ,FOIL method ,Deposition (law) - Abstract
The effect of ytterbium oxide (174Yb2O3) deposition in modifying the material s and electrical properties of mechanically rolled tantalum (MRTa) thin foil is investigated through electron microscopic, crystallographic, elemental analysis, and current-voltage (I–V) characteristics. A 0.82 μm thick layer of 174Yb2O3 over ∼2.1 μm thick MRTa foil (Yb2O3/Ta) reduces the dimension of surface features, and indicates formation of nanoparticles. The electron beam imaging, energy dispersive X-ray (EDX), and X-ray diffraction (XRD) analysis reveal formation of uniformly distributed Yb2O3 on MRTa surface and chemical inertness of the newly formed Yb2O3/MRTa thin film towards oxidation. The room temperature I–V characteristics of both the MRTa foil and Yb2O3/MRTa thin film tested with silver (Ag) top contact electrodes exhibit ohmic conductions and demonstrate an overall enhancement of 92.1% in electrical conductivity after Yb2O3 thin film deposition on MRTa foil.
- Published
- 2019