1. Polarization sensitive optical coherence tomography for technical materials investigation
- Author
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Bogdan B. Kosmowski, Jerzy Pluciński, Ryszard Hypszer, Małgorzata Jędrzejewska-Szczerska, Maciej Maciejewski, and Marcin R. Strąkowski
- Subjects
Materials science ,Optical anisotropy ,genetic structures ,medicine.diagnostic_test ,business.industry ,Scattering ,Physics::Medical Physics ,Metals and Alloys ,Polarimetry ,Condensed Matter Physics ,Polarization (waves) ,eye diseases ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Polarization sensitive ,Optics ,Optical coherence tomography ,medicine ,Optoelectronics ,sense organs ,Electrical and Electronic Engineering ,business ,Instrumentation - Abstract
Optical coherence tomography (OCT) is a unique technique of noncontact and nondestructive examination of wide range of highly scattering materials. Introduce a polarization state analysis in OCT gives new possibilities in technical materials investigation and characterization. Polarization sensitive optical coherence tomography (PS-OCT) is capable to investigate not only a material's inner structure, but also determining its local properties of optical anisotropy. In this paper, the principles of OCT and its basic modifications focused on polarization-sensitive OCT have been presented. The experimental setup of PS-OCT has been shown, as well as an application of this technique for investigation of internal structure of materials. The experimental results of investigation of transparent and high scattering materials have been presented.
- Published
- 2008
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