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Author(s): T. Yoshie [1]; A. Scherer [1]; J. Hendrickson [2]; G. Khitrova (corresponding author) [2]; H. M. Gibbs [2]; G. Rupper [2]; C. Ell [2]; O. B. Shchekin [3]; D. [...]

Electron gas in the conduction channel of a Field Effect Transistor (FET) can support collective plasma oscillations tunable by the gate voltage. In the Dyakonov-Shur terahertz (THz) detector, nonlinearities in the plasma wave propagation in the gated channel of a FET lead to a constant source-to-drain voltage providing the detector output. We present the detector theory in the frame of the hydrodynamic model using the electron plasma Navier-Stokes and thermal transport equations, thus fully accounting for the hydrodynamic non-linearity, the viscosity, and pressure gradients in the detector response. Both resonant and broadband operations of the high electron mobility transistor (HEMT) based plasmonic detectors are described by this model. The relation between the electron channel density and gate voltage was modeled by the unified charge control model applicable both above and below the threshold voltage. The theoretical results are compared with the response measured in the short channel InGaAs HEMT and the analytical approximation. The THz source was operating at 1.63 THz, and the response was measured at varying signal intensities. The response of the detector operated in the open drain mode was measured above and below the threshold, and the theoretical and experimental results are shown to be in good agreement. [ABSTRACT FROM AUTHOR]

The design of doped n-p-n semiconductor heterostructures has a significant influence on the structures' nonradiative decay and can also affect their photoluminescence characteristics. Such structures have recently been explored in the context of semiconductor laser cooling. We present a theoretical analysis of optically excited n-p-n structures, focusing mainly on the influence of the layer thicknesses and doping concentrations on nonradiative interface recombination. We find that high levels of n-doping (1019 cm-3) can reduce the minority-carrier density at the interface and increase the nonradiative lifetime. We calculate time-dependent luminescence decay and find them to be in good agreement with experiment for temperatures >120 K, which is the temperature range in which our model assumptions are expected to be valid. A theoretical analysis of the cooling characteristics of n-p-n structures elucidates the interplay of nonradiative, radiative, and Auger recombination processes. We show that at high optical excitation densities, which are necessary for cooling, the undesired nonradiative interface recombination rates for moderate (1017 cm-3) n-doping concentrations are drastically increased, which may be a major hindrance in the observation of laser cooling of semiconductors. On the other hand, high n-doping concentrations are found to alleviate the problem of increased nonradiative rates at high excitation densities, and for the model parameters used in the calculation we find positive cooling efficiencies over a wide range of excitation densities. [ABSTRACT FROM AUTHOR]