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We characterize the phase noise of a microwave photonic channel, where a 10 GHz signal is carried by an intensity-modulated light beam over a short optical fiber, and detected. Two options are compared, (i) an electro-optic modulator (EOM), and (ii) the direct modulation of the laser current. The 1.55~$\mu$m laser and the detector are the same. The effect of experimental parameters is investigated, the main of which are the microwave power and the laser bias current. The main result is that the upper bound of the phase flicker is $-117$~dBrad$^2$ in the case of the EOM, limited by the background noise of the setup. In contrast, with direct modulation of the laser, the flicker is of $-114$ to $-100$~dBrad$^2$, depending on the laser bias current (50--90~mA), and the highest noise occurs at the lowest bias. Our results are of interest in communications, radar systems, instrumentation and metrology., Comment: 5 pages, 5 figures, 1 table, 43 bibliographic references

We report in this letter the outstanding frequency stability performances of an autonomous cryogenique sapphire oscillator presenting a flicker frequency noise floor below 2e-16 near 1,000 s of integration time and a long term Allan Deviation (ADEV) limited by a random walk process of 1e-18/sqr(tau). The frequency stability qualification at this level called for the implementation of sophisticated instrumentation associated with ultra-stable frequency references and ad hoq averaging and correlation methods., Comment: 4 pages, 2 figures

The cryogenic sapphire oscillator (CSO) is a highly specialized machine, which delivers a reference signal exhibiting the lowest frequency fluctuations. For the best units, the Allan deviation (ADEV) is <1e-15 for integration time between 1 and 10,000 s, with a drift <1e-14 in one day.The oscillator is based on a sapphire monocrystal resonating at 10 GHz in a whispering-gallery mode, cooled at 6 K for highest Q-factor and zero thermal coefficient. We report on the progress accomplished implementing eleven CSOs in about 10 years since the first sample delivered to the ESA station in Argentina. Short-term stability is improved by a factor of 3-10, depending on the integration time, and the refrigerator's electric power is reduced to 3 kW. Frequency stability and overall performances are reproducible, with unattended operation between scheduled maintenance every two years. The CSO is suitable to scientific applications requiring extreme frequency stability with reliable long-term operation. For example, the flywheel for primary frequency standards, the ground segment of GNSS, astrometry, VLBI, and radio astronomy stations., Comment: 7 pages, 12 figures

This article addresses the measurement of the power spectrum of red noise processes at the lowest frequencies, where the minimum acquisition time is so long that it is impossible to average on a sequence of data record. Therefore, averaging is possible only on simultaneous observation of multiple instruments. This is the case of radio astronomy, which we take as the paradigm, but examples may be found in other fields such as climatology and geodesy. We compare the Bayesian confidence interval of the red-noise parameter using two estimators, the spectrum average and the cross-spectrum. While the spectrum average is widely used, the cross-spectrum using multiple instruments is rather uncommon. With two instruments, the cross-spectrum estimator leads to the Variance-Gamma distribution. A generalization to $q$ devices is provided, with the example of the observation of millisecond pulsars with 5 radio telescopes., Comment: 10 pages, 7 figures and 3 tables

Phase noise and frequency (in)stability both describe the fluctuation of stable periodic signals, from somewhat different standpoints. Frequency is unique compared to other domains of metrology, in that its fluctuations of interest span at least 14 orders of magnitude, from $10^{-4}$ in a mechanical watch to $10^{-18}$ in atomic clocks. The frequency span of interest is some 12-15 orders of magnitude, from $\mu$Hz to GHz Fourier frequency for phase noise, while the time span over which the fluctuations occur ranges from sub-$\mu$s to years integration time for variances. Because this domain is ubiquitous in science and technology, a common language and tools suitable to the variety mentioned are a challenge. This article is at once (1) a tutorial, (2) a review covering the most important facts about phase noise, frequency noise and two-sample (Allan and Allan-like) variances, and (3) a user guide to "Enrico's Chart of Phase Noise and Two-Sample Variances." In turn, the Chart is a reference card collecting the most useful concepts, formulas and plots in a single A4/A-size sheet, intended to be a staple on the desk of whoever works with these topics. The Chart is available under Creative Commons 4.0 CC-BY-NC-ND license from Zenodo, DOI 10.5281/zenodo.4399218. A wealth of auxiliary material is available for free on the Enrico's home page http://rubiola.org., Comment: 30 pages, 18 figures, 3 tables, 173 references

Frequency metrology outperforms any other branch of metrology in accuracy (parts in $10^{-16}$) and small fluctuations ($<10^{-17}$). In turn, among celestial bodies, the rotation speed of millisecond pulsars (MSP) is by far the most stable ($<10^{-18}$). Therefore, the precise measurement of the time of arrival (TOA) of pulsar signals is expected to disclose information about cosmological phenomena, and to enlarge our astrophysical knowledge. Related to this topic, Pulsar Timing Array (PTA) projects have been developed and operated for the last decades. The TOAs from a pulsar can be affected by local emission and environmental effects, in the direction of the propagation through the interstellar medium or universally by gravitational waves from super massive black hole binaries. These effects (signals) can manifest as a low-frequency fluctuation over time, phenomenologically similar to a red noise. While the remaining pulsar intrinsic and instrumental background (noise) are white. This article focuses on the frequency metrology of pulsars. From our standpoint, the pulsar is an accurate clock, to be measured simultaneously with several telescopes in order to reject the uncorrelated white noise. We apply the modern statistical methods of time-and-frequency metrology to simulated pulsar data, and we show the detection limit of the correlated red noise signal between telescopes., Comment: 11 pages, 10 figures, 2 tables, 1 appendix

This paper presents a very simple method ensuring the independence of consecutive spectra of the phase or frequency noise of an oscillator. This condition is essential for using cross-spectrum averages., Comment: 8 pages, 5 figures

Oscillator fluctuations are described as the phase or frequency noise spectrum, or in terms of a wavelet variance as a function of the measurement time. The spectrum is generally approximated by the `power law,' i.e., a Laurent polynomial with integer exponents of the frequency. This article extends the domain of application of PVAR, a wavelet variance which uses the linear regression on phase data to estimate the frequency, and called `parabolic' because such regression is equivalent to a parabolic-shaped weight function applied to frequency fluctuations. In turn, PVAR is relevant in that it improves on the widely-used Modified Allan variance (MVAR) enabling the detection of the same noise processes at the same confidence level in a shorter measurement time. More specifically, we provide (i) the analytical expression of the response of the PVAR to the frequency-noise spectrum in the general case of non-integer exponents of the frequency, and (ii) a useful approximate expression of the statistical uncertainty., Comment: 6 pages, 4 figures

The cross-spectrum method consists in measuring a signal $c(t)$ simultaneously with two independent instruments. Each of these instruments contributes to the global noise by its intrinsec (white) noise, whereas the signal $c(t)$ that we want to characterize could be a (red) noise. We first define the real part of the cross-spectrum as a relevant estimator. Then, we characterize the probability density function (PDF) of this estimator knowing the noise level (direct problem) as a Variance-Gamma (V$\Gamma$) distribution. Next, we solve the "inverse problem" thanks to Bayes' theorem to obtain an upper limit of the noise level knowing the estimate. Checked by massive Monte Carlo simulations, V$\Gamma$ proves to be perfectly reliable to any number of degrees of freedom (dof). Finally we compare this method with an other method using the Karhunen-Lo\`{e}ve transfrom (KLT). We find an upper limit of the signal level slightly different as the one of V$\Gamma$ since KLT better takes into account the available informations., Comment: 10 pages (2 columns), 5 figures, 3 tables, 34 references

Magnetoelastic sensors for the detection of low-frequency and low-amplitude magnetic fields are in the focus of research since more than 30 years. In order to minimize the limit of detection (LOD) of such sensor systems, it is of high importance to understand and to be able to quantify the relevant noise sources. In this contribution, cantilever-type electromechanic and magnetoelastic resonators, respectively, are comprehensively investigated and mathematically described not only with regard to their phase sensitivity but especially to the extent of the sensor-intrinsic phase noise. Both measurements and calculations reveal that the fundamental LOD is limited by additive phase noise due to thermal-mechanical noise of the resonator, i.e. by thermally induced random vibrations of the cantilever, and by thermal-electrical noise of the piezoelectric material. However, due to losses in the magnetic material parametric flicker phase noise arises, limiting the overall performance. In particular it is shown that the LOD is virtually independent of the magnetic sensitivity but is solely determined by the magnetic losses. Instead of the sensitivity, the magnetic losses, represented by the material's effective complex permeability, should be considered as the most important parameter for the further improvement of such sensors in the future. This implication is not only valid for magnetoelastic cantilevers but also applies to any type of magnetoelastic resonator.

The correlation of phase fluctuations in any type of oscillator fundamentally defines its spectral shape. However, in nonlinear oscillators, such as spin torque nano oscillators, the frequency spectrum can become particularly complex. This is specifically true when not only considering thermal but also colored $1/f$ flicker noise processes, which are crucial in the context of the oscillator's long term stability. In this study, we address the frequency spectrum of spin torque oscillators in the regime of large-amplitude steady oscillations experimentally and as well theoretically. We particularly take both thermal and flicker noise into account. We perform a series of measurements of the phase noise and the spectrum on spin torque vortex oscillators, notably varying the measurement time duration. Furthermore, we develop the modelling of thermal and flicker noise in Thiele equation based simulations. We also derive the complete phase variance in the framework of the nonlinear auto-oscillator theory and deduce the actual frequency spectrum. We investigate its dependence on the measurement time duration and compare with the experimental results. Long term stability is important in several of the recent applicative developments of spin torque oscillators. This study brings some insights on how to better address this issue.

This article deals with the erratic and inconsistent phase-noise spectra often seen in low-noise oscillators, whose floor is of the order of $-180$ dBc/Hz or less. Such oscillators are generally measured with two-channel instruments based on averaging two simultaneous and statistically independent measures. Our new method consists of inserting a dissipative attenuator between the oscillator under test and the phase-noise analyzer. The thermal noise of the attenuator introduces a controlled amount of phase noise. We compare the phase noise floor to the theoretical expectation with different values of the attenuation in small steps. The analysis reveals a negative bias (underestimation of phase noise) due to the thermal energy of the internal power splitter at the instrument input, and an uncertainty due to crosstalk between the two channels. In not-so-rare unfortunate cases, the bias results in a negative phase-noise spectrum, which is an obvious nonsense. Similar results are observed separately in three labs with instruments from the two major brands. We give experimental evidence, full theory, and suggestions to mitigate the problem. Our multiple-attenuators method provides quantitative information about the correlation phenomena inside the instrument., Comment: 24 pages, 10 figures, 1 table, 38 references

We present a first experimental characterization of our ultra-compact, ultra-stable laser. The heart of the apparatus is an original Fabry-Perot cavity with a 25 mm length and a pyramidal geometry, equipped with highly-reflective crystalline coatings. The cavity, along with its vacuum chamber and optical setup, fits inside a 30 L volume. We have measured the cavity thermal and vibration sensitivities, and present a first estimation of the cavity fractional frequency instability at $\sigma_y(1\rm{s})=7.5{\times}10^{-15}$., Comment: 4 pages, 5 figures

Low frequency noise close to the carrier remains little explored in spin torque nano oscillators. However, it is crucial to investigate as it limits the oscillator's frequency stability. This work addresses the low offset frequency flicker noise of a TMR-based spin-torque vortex oscillator in the regime of large amplitude steady oscillations. We first phenomenologically expand the nonlinear auto-oscillator theory aiming to reveal the properties of this noise. We then present a thorough experimental study of the oscillator's $1/f$ flicker noise and discuss the results based on the theoretical predictions. Hereby, we connect the oscillator's nonlinear dynamics with the concept of flicker noise and furthermore refer to the influence of a standard $1/f$ noise description based on the Hooge formula, taking into account the non-constant magnetic oscillation volume, which contributes to the magnetoresistance., Comment: 10 pages

This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for the analyzer to feature AN measurement. An obvious variant enables AN and PN measurements using an AN analyzer with no PN measurement capability. Such instrument is extremely simple and easy to implement with a power-detector diode followed by a FFT analyzer. Unlike the classical bridge (interferometric) method, there is no need for external line stretcher and variable attenuators because phase and amplitude control is implemented in the device under test. In one case (AD9144), we could measure the noise over 10 decades of frequency. The flicker noise matches the exact $1/f$ law with a maximum discrepancy of $\pm1$ dB over 7.5 decades. Thanks to simplicity, reliability, and low background noise, this method has the potential to become the standard method for the AN and PN measurement of DACs and DDSs., Comment: Extended version, after a talk given at the IEEE IFCS, Orlando, FL, USA, April 2019. 22 pages, 10 figures, 48 references

The three-cornered hat / Groslambert Covariance methods are widely used to estimate the stability of each individual clock in a set of three, but no method gives reliable confidence intervals for large integration times. We propose a new KLTS (Karhunen-Lo\`eve Tansform using Sufficient statistics) method which uses these estimators to take into account the statistics of all the measurements between the pairs of clocks in a Bayesian way. The resulting Cumulative Density Function (CDF) yields confidence intervals for each clock AVAR. This CDF provides also a stability estimator which is always positive. Checked by massive Monte-Carlo simulations, KLTS proves to be perfectly reliable even for one degree of freedom. An example of experimental measurement is given., Comment: 7 pages, 5 figures

Transmission surface acoustic wave (SAW) sensors are widely used in various fields of application. In order to maximize the limit of detection (LOD) of such sensor systems, it is of high importance to understand and to be able to quantify the relevant noise sources. In this paper, low noise readout systems for the application with a SAW delay line magnetic field sensor in an open-loop and closed-loop configuration are presented and analyzed with regard to their phase noise contribution. By applying oscillator phase noise theory to closed-loop sensor systems, it is shown that the phase noise of the SAW delay line oscillator can be predicted accurately. This allows the derivation of expressions for the limits of detection for both readout structures. Based on these equations, the equivalence between the LOD of open-loop and closed-loop SAW delay line readout can be shown analytically, assuming that the sensor contributes the dominant phase noise. This equality is verified by measurements. These results are applicable to all kinds of phase sensitive delay line sensors.

Surface acoustic wave (SAW) sensors in the form of two-port resonators or delay lines are widely used in various fields of application. Readout of such sensors is achieved by electronic systems operating either in an open-loop or in a closed-loop configuration. The mode of operation of the sensor system is usually chosen based on requirements like e.g. bandwidth, dynamic range, linearity, costs, and immunity against environmental influences. Because the limit of detection (LOD) at the output of a sensor system is often one of the most important figures of merit, both readout structures, i.e. open-loop and closed-loop systems, are analyzed in terms of the minimum achievable LOD. Based on a comprehensive phase noise analysis of these structures for both, resonant sensors and delay line sensors, expressions for the various limits of detection are derived. Under generally valid conditions equivalence of open-loop and closed-loop operation is shown for both types of sensors. These results are not only valid for SAW devices but are also applicable to all kinds of phase sensitive sensors.

We report on the characterization, including residual phase noise and fractional frequency instability, of fiber-coupled PPLN non-linear crystals. These components are devoted to frequency doubling 871 nm light from an extended-cavity diode laser to produce a 435.5 nm beam, corresponding to the ytterbium ion electric quadrupole clock transition. We measure doubling efficiencies of up to 117.5 %/W. Using a Mach-Zehnder interferometer and an original noise rejection technique, the residual phase noise of the doublers is estimated to be lower than ${\rm -35\, dBrad^2/Hz}$ at 1 Hz, making these modules compatible with up-to-date optical clocks and ultra-stable cavities. The influence of external parameters such as pump laser frequency and intensity is investigated, showing that they do not limit the stability of the frequency-doubled signal. Our results demonstrate that such compact, fiber-coupled modules are suitable for use in ultra-low phase noise metrological experiments, including transportable optical atomic clocks., Comment: 4 pages, 3 figures

This article explains phase noise, jitter, and some slower phenomena in digital integrated circuits, focusing on high-demanding, noise-critical applications. We introduce the concept of phase type and time type phase noise. The rules for scaling the noise with frequency are chiefly determined by the spectral properties of these two basic types, by the aliasing phenomenon, and by the input and output circuits. Then, we discuss the parameter extraction from experimental data and we report on the measured phase noise in some selected devices of different node size and complexity. We observed flicker noise between -80 and -130 dBrad^2/Hz at 1 Hz offset, and white noise down to -165 dBrad^2/Hz in some fortunate cases and using the appropriate tricks. It turns out that flicker noise is proportional to the reciprocal of the volume of the transistor. This unpleasant conclusion is supported by a gedanken experiment. Further experiments provide understanding on: (i) the interplay between noise sources in the internal PLL, often present in FPGAs; (ii) the chattering phenomenon, which consists in multiple bouncing at transitions; and (iii) thermal time constants, and their effect on phase wander and on the Allan variance., Comment: 25 pages, 16 figures, 41 references

Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the Cross Spectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal channels which measure the same input, and reject the background of the instrument. We show that a systematic error is always present if the thermal energy of the input power splitter is not accounted for. Such error can result in noise under estimation up to a few dB in the lowest-noise quartz oscillators, and in a complete nonsense in the case of cryogenic oscillators. As another alarming fact, the presence of metamaterial components in the oscillator results in unpredictable behavior and large errors, even in well controlled experimental conditions. We observed a spread of 40 dB in the phase noise spectra of an oscillator, just replacing the output filter., Comment: 20 pages, 11 figures, 37 bibliography items

The Omega-preprocessing was introduced to improve phase noise rejection by using a least square algorithm. The associated variance is the PVAR which is more efficient than MVAR to separate the different noise types. However, unlike AVAR and MVAR, the decimation of PVAR estimates for multi-tau analysis is not possible if each counter measurement is a single scalar. This paper gives a decimation rule based on two scalars, the processing blocks, for each measurement. For the Omega-preprocessing, this implies the definition of an output standard as well as hardware requirements for performing high-speed computations of the blocks.

We present the characterization of commercial tunnel diode low-level microwave power detectors at room and cryogenic temperatures. The sensitivity as well as the output voltage noise of the tunnel diodes are measured as functions of the applied microwave power, the signal frequency being 10 GHz. We highlight strong variations of the diode characteristics when the applied microwave power is higher than few microwatt. For a diode operating at ${4}$ K, the differential gain increases from ${1,000}$ V/W to about ${4,500}$ V/W when the power passes from ${-30}$ dBm to ${-20}$ dBm. The diode present a white noise floor equivalent to a NEP of ${0.8}$ pW/ ${\sqrt{\mathrm{Hz}}}$ and ${8}$ pW/${ \sqrt{\mathrm{Hz}}}$ at 4 K and 300 K respectively. Its flicker noise is equivalent to a relative amplitude noise power spectral density ${S_{\alpha}(1~\mathrm{Hz})=-120}$~dB/Hz at ${4}$ K. Flicker noise is 10 dB higher at room temperature., Comment: 8 pages and 16 figures

We present the characterisation of three Cryogenic Sapphire Oscillators using the three-corner-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyse the frequency stability limitations of these state-of-the-art ultra-stable oscillators. The best unit presents a fractional frequency stability better than 5e-16 at 1 s and below 2e-16 for integration times less than 5,000s., Comment: 7 pages, 8 figures

Here, we study the paramagnetic ions behavior in presence of a strong microwave electromagnetic field sustained inside a cryogenic sapphire whispering gallery mode resonator. The high frequency measurement resolution that can be now achieved by comparing two CSOs permit for the first time to observe clearly the non-linearity of the resonator power sensitivity. These observations that in turn allow us to optimize the CSO operation, are well explained by the Electron Spin Resonance (ESR) saturation of the paramagnetic impurities contained in the sapphire crystal., Comment: 8 pages, 9 figures

This article reports on the long-term frequency stabilty characterisation of a new type of cryogenic sapphire oscillator using an autonomous pulse-tube cryocooler as its cold source. This new design enables a relative frequency stability of better than 4.5e-15 over one day of integration. This represents to our knowledge the best long-term frequency stability ever obtained with a signal source based on a macroscopic resonator., Comment: 9 pages, 5 figures

The oscillator, inherently, turns the phase noise of its internal components into frequency noise, which results into a multiplication by 1/f^2 in the phase-noise power spectral density. This phenomenon is known as the Leeson effect. This report extends the Leeson effect to the analysis of amplitude noise. This is done by analyzing the slow-varying complex envelope, after freezing the carrier. In the case of amplitude noise, the classical analysis based on the frequency-domain transfer function is possible only after solving and linearizing the complete differential equation that describes the oscillator. The theory predicts that AM noise gives an additional contribution to phase noise. Beside the detailed description of the traditional oscillator, based on the resonator governed by a second-order differential equation (microwave cavity, quartz oscillators etc.), this report is a theoretical framework for the analysis of other oscillators, like for example the masers, lasers, and opto-electronic oscillators. This manuscript is intended as a standalone report, and also as complement to the book E. Rubiola, Phase Noise and Frequency Stability in Oscillators, Cambridge University Press, 2008. ISBN 978-0-521-88677-2 (hardback), 978-0-521-15328-7 (paperback)., Comment: 48 pages, 34 figures, table of contents, list of symbols

The noise of a device under test (DUT) is measured simultaneously with two instruments, each of which contributes its own background. The average cross power spectral density converges to the DUT power spectral density. This method enables the extraction of the DUT noise spectrum, even if it is significantly lower than the background. After a snapshot on practical experiments, we go through the statistical theory and the choice of the estimator. A few experimental techniques are described, with reference to phase noise and amplitude noise in RF/microwave systems and in photonic systems. The set of applications of this method is wide. The final section gives a short panorama on radioastronomy, radiometry, quantum optics, thermometry (fundamental and applied), semiconductor technology, metallurgy, etc. This report is intended as a tutorial, as opposed to a report on advanced research, yet addressed to a broad readership: technicians, practitioners, Ph.D. students, academics, and full-time scientists., Comment: 40 pages, table of symbols, 19 figures, 30 references. Slides available on http://rubiola.org

Understanding the amplifier phase noise is a critical issue in numerous fields of engineering and physics, like oscillators, frequency synthesis, telecommunications, radars, spectroscopy, in the emerging domain of microwave photonics, and in more exotic domains like radio astronomy, particle accelerators, etc. This article analyzes the two main types of phase noise in amplifiers, white and flicker. White phase noise results from adding white noise to the RF spectrum around the carrier. For a given amount of RF noise added, noise is proportional to the inverse of the carrier power. By contrast, the 1/f coefficient is a constant parameter of the amplifier, in a wide range of carrier power. This fact has amazing consequences on different amplifier topologies. Connecting m equal amplifiers in parallel, flicker is 1/m times that of one device. Cascading m equal amplifiers, flicker is m times that of one amplifier. Recirculating the signal in an amplifier so that the gain increases by a power of m (a factor of m in dB) due to positive feedback (regeneration), which for integer m is similar to the case of m amplifiers, we find that flicker is m^2 times that of the amplifier alone. Starting from the fact that near-dc flicker exists in all electronic devices, although generally not accessible from outside, the simplest model for the 1/f phase noise is that the near-dc 1/f noise phase-modulates the carrier through some parametric effect in the semiconductor. This model predicts the behavior of the (simple) amplifier and of the different amplifier topologies. Numerous measurements on amplifiers from different technologies and frequencies (HF to microwaves), also including some obsolete amplifiers, validate the theory., Comment: 22 pages, 11 figures, 54 citations

The first step, before investigating physical origins of noise in resonators, is to investigate correlations between external measurement parameters and the resonator noise. Tests and measurements are mainly performed on an advanced phase noise measurement system, recently set up. The resonator noise is examined as a function of the sensitivity to the drive level, the temperature operating point and the tuning capacitor., Comment: 20th International Conference on Noise and Fluctuations, Pisa : Italie (2009)

This report describes a method for the primary calibration of phase noise and amplitude noise measurement systems. In the field of metrology, the term "primary" refers to a standard whose quantity value and measurement uncertainty are established without relation to another measurement standard for a quantity of the same kind; or to a procedure used to realize the definition of a measurement unit and obtain the quantity value and measurement uncertainty of a primary measurement standard. Accordingly, a phase and a normalized amplitude have to rely on ratio measurements., Comment: 33 pages, 19 figures, 4 tables, 33 references

As a consequence of a general trend in the physics of oscillators and clocks towards optics, phase and frequency metrology is rapidly moving to optics too. Yet, optics is not replacing the traditional radio-frequency (RF) and microwave domains. Instead, it adds tough challenges. Precision frequency-stability measurements are chiefly based on the measurement of phase noise, which is the main focus of this article. Major progress has been achieved in two main areas. The first is the extreme low-noise measurements, based on the bridge (interferometric) method in real time or with sophisticated correlation and averaging techniques. The second is the emerging field of microwave photonics, which combines optics and RF/microwaves. This includes the femtosecond laser, the two-way fiber links, the noise measurement systems based on the fiber and the photonic oscillator. Besides, the phenomenology of flicker (1/f) noise is better understood, though the ultimate reasons are still elusive., Comment: Invited. 7th Symposium on Frequency Standards and Metrology, 5-11 October 2008, Pacific Grove, California, USA. 10 pages, 10 figures, 20 references

The optical fiber used as a microwave delay line exhibits high stability and low noise and makes accessible a long delay (>100 microseconds) in a wide bandwidth (about 40 GHz, limited by the optronic components). Hence, it finds applications as the frequency reference in microwave oscillators and as the reference discriminator for the measurement of phase noise. The fiber is suitable to measure the oscillator stability with a sensitivity of parts in 1E-12. Enhanced sensitivity is obtained with two independent delay lines, after correlating and averaging. Short-term stability of parts in 1E-12 is achieved inserting the delay line in an oscillator. The frequency can be set in steps multiple of the inverse delay, which is in the 10-100 kHz region. This article adds to the available references a considerable amount of engineering and practical knowledge, the understanding of 1/f noise, calibration, the analysis of the cross-spectrum technique to reduce the instrument background, the phase-noise model of the oscillator, and the experimental test of the oscillator model., Comment: 23 pages, 13 figures, 41 references

We introduce a stochastic model for the determination of phase noise in optoelectronic oscillators. After a short overview of the main results for the phase diffusion approach in autonomous oscillators, an extension is proposed for the case of optoelectronic oscillators where the microwave is a limit-cycle originated from a bifurcation induced by nonlinearity and time-delay. This Langevin approach based on stochastic calculus is also successfully confronted with experimental measurements., Comment: 18 pages, 7 figures, 11 references. Submitted to IEEE J. of Quantum Electronics, May 2008

High-stability quartz oscillators are needed in a number of space applications. A short-term stability of parts in 10^{-14} [Allan deviation \sigma y(\tau) ] is sometimes required, for integration time \tau of approximately 1-10 s. The Centre National d'Etudes Spatiales (CNES) and the FEMTO-ST Institute (formerly LPMO and LCEP), have been collaborating for many years in this domain, aiming at measuring and at understanding the oscillator noise. The highest stability has been observed on 5 MHz and 10 MHz bulk acoustic-wave resonators. Yet this stability is still not sufficient, or the the manufacturing method is not reproducible. Recently, the analysis of a few premium-stability oscillators has demonstrated that the oscillator frequency instability is due to the fluctuation of the resonator natural frequency, rather than to the noise of the sustaining amplifier via the Leeson effect. It is therefore natural to give attention to the measurement of the resonator fluctuations.

We analyze the phase-noise measurement methods in which correlation and averaging is used to reject the background noise of the instrument. All the known methods make use of a mixer, used either as a saturated phase detector or as a linear synchronous detector. Unfortunately, AM noise is taken in through the power-to-dc-offset conversion mechanism that results from the mixer asymmetry. The measurement of some mixers indicates that the unwanted amplitude-to-voltage gain is of the order of 5-50 mV, which is 12-35 dB lower than the phase-to-voltage gain of the mixer. In addition, the trick of setting the mixer at a sweet point -- off the quadrature condition -- where the sensitivity to AM nulls, works only with microwave mixers. The HF-VHF mixers have not this sweet point. Moreover, we prove that if the AM noise comes from the oscillator under test, it can not be rejected by correlation. At least not with the schemes currently used. An example shows that at some critical frequencies the unwanted effect of AM noise is of the same order -- if not greater -- than the phase noise. Thus, experimental mistakes are around the corner., Comment: 16 pages, list of symbols, 8 figures, 27 references

Smart use of mixers is a relevant issue in radio engineering and in instrumentation design, and of paramount importance in phase noise metrology. However simple the mixer seems, every time I try to explain to a colleague what it does, something goes wrong. One difficulty is that actual mixers operate in a wide range of power (150 dB or more) and frequency (up to 3 decades). Another difficulty is that the mixer works as a multiplier in the time-domain, which is necessary to convert frequencies. A further difficulty is the interaction with external circuits, the input sources and the load. Yet far the biggest difficulty is that designing with mixers requires a deep comprehension of the whole circuit at system level and at a component level. As the electronic-component approach is well explained in a number of references, this tutorial emphasizes the system approach, aiming to provide wisdom and insight on mixes., Comment: 52 pages, 36 figures, 30 references

The frequency flicker of an oscillator, which appears as a 1/f^3 line in the phase noise spectral density, and as a floor on the Allan variance plot, originates from two basic phenomena, namely: (1) the 1/f phase noise turned into 1/f frequency noise via the Leeson effect, and (2) the 1/f fluctuation of the resonator natural frequency. The discussion on which is the dominant effect, thus on how to improve the stability of the oscillator, has been going on for years without giving a clear answer. This article tackles the question by analyzing the phase noise spectrum of several commercial oscillators and laboratory prototypes, and demonstrates that the fluctuation of the resonator natural frequency is the dominant effect. The investigation method starts from reverse engineering the oscillator phase noise in order to show that if the Leeson effect was dominant, the resonator merit factor Q would be too low as compared to the available technology., Comment: 20 pages, list of symbols, 1 table, 6 figures, 43 references

The close-in AM noise is often neglected, under the assumption that it is a minor problem as compared to phase noise. With the progress of technology and of experimental science, this assumption is no longer true. Yet, information in the literature is scarce or absent. This report describes the measurement of the AM noise of rf/microwave sources in terms of Salpha(f), i.e., the power spectrum density of the fractional amplitude fluctuation alpha. The proposed schemes make use of commercial power detectors based on Schottky and tunnel diodes, in single-channel and correlation configuration. There follow the analysis of the front-end amplifier at the detector output, the analysis of the methods for the measurement of the power-detector noise, and a digression about the calibration procedures. The measurement methods are extended to the relative intensity noise (RIN) of optical beams, and to the AM noise of the rf/microwave modulation in photonic systems. Some rf/microwave synthesizers and oscillators have been measured, using correlation and moderate averaging. As an example, the flicker noise of a low-noise quartz oscillator (Wenzel 501-04623E) is Salpha = 1.15E-13/f, which is equivalent to an Allan deviation of sigma_alpha = 4E-7. The measurement systems described exhibit the world-record lowest background noise., Comment: 39 pages, 22 figures, 8 tables, 21 references, list of symbols

The microwave signal at the output of a photodiode that detects a modulated optical beam contains the phase noise phi(t) and the amplitude noise alpha(t) of the detector. Beside the white noise, which is well understood, the spectral densities S_phi(f) and S_alpha(f) show flicker noise, proportional to 1/f. We report on the measurement of the phase and amplitude noise of high-speed p-i-n photodiodes. The main result is that the flicker coefficient of the samples is approximately 1E-12 rad^2/Hz (-120dB) for phase noise, and approximately 1E-12 Hz^-1 (-120dB) for amplitude noise. These values could be observed only after solving a number of experimental problems and in a protected environment. By contrast, in ordinary conditions insufficient EMI isolation, and also insufficient mechanical isolation, are responsible for additional noise to be taken in. This suggests that if package and EMC are revisited, applications can take the full benefit from the surprisingly low noise of the p-i-n photodiodes., Comment: 11 pages, 3 figures, 24 references

The measurement of the close-to-the-carrier noise of rf and microwave devices is a relevant issue in time and frequency metrology and in some fields of electronics, physics and optics. While phase noise is the main concern, amplitude noise is often of interest. The highest sensitivity is achieved with the bridge (interferometric) method, which consists of the amplification and synchronous detection of the noise sidebands after suppressing the carrier by vector subtraction of an equal signal. A substantial progress in understanding the flicker noise mechanism of the interferometer results in new schemes that improve by 20--30 dB the sensitivity at low Fourier frequencies. The article provides the complete theory and detailed design criteria, and reports on the implementation of a prototype. In real-time measurements, a background noise of -175 -180 dBrad^2/Hz has been obtained at f=1 Hz off the 100 MHz carrier. Exploiting correlation and averaging in similar conditions, the sensitivity exceeds -185 dBrad^2/Hz at f=1 Hz. A residual noise of -203 dBrad^2/Hz at f=250 Hz off the carrier has been obtained, while the ultimate noise floor is still limited by the averaging capability of the correlator. This is equivalent to a S/N ratio of 2E20 with a frequency spacing of 2.5E-6. Applications include the measurement of the properties of materials and the observation of weak flicker-type physical phenomena, out of reach for other instruments. We measured the flicker noise of a by-step attenuator (-171 dB[rad^2]/Hz at f=1 Hz) and of the ferrite noise of a reactive power divider (-173.7 dB[rad^2]/Hz at f=1 Hz) without need of correlation., Comment: 30 pages, 15 figures, 35 references

This article analyzes the design of a low-noise amplifier intended as the input front-end for the measurement of the low-frequency components (below 10 Hz) of a 50 Ohm source. Low residual flicker is the main desired performance. This feature can only be appreciated if white noise is sufficiently low, and if an appropriate design ensures dc stability. An optimal solution is proposed, in which the low-noise and dc-stability features are achieved at a reasonable complexity. Gain is accurate to more than 100 kHz, which makes the amplifier an appealing external front-end for fast Fourier transform (FFT) analyzers., Comment: 11 pages, 6 figures, 19 references

Time, and equivalently frequency, is the most precisely measured physical quantity. It is therefore inevitable that virtually all domains of engineering and physics need reference oscillators. The oscillator noise can be decomposed into amplitude noise and phase noise. The latter, far more important, affects timing, for it is related to precision and accuracy of measurements. The oscillator, inherently, turns the phase noise of the internal parts into frequency noise. This is a necessary consequence of the Barkhausen condition, which states that the loop gain must be of one, with zero phase, for stationary oscillation. There follows that oscillator phase noise, which is the integral of the frequency noise, diverges in the long run. This is the Leeson effect. The topics covered can be divided into three parts. Chapter 1 addresses language and general physical mechanisms. Chapter 2 aims at understanding the inside of commercial oscillators through the analysis of the specifications. Chapter 3 and 4 focus on the use of the Laplace transform to describe the oscillator and its phase noise. Since spring 2004, I had the opportunity to give some seminars on noise in oscillators at the Jet Propulsion Laboratory, at the IEEE Frequency Control Symposium, at the FEMTO-ST Laboratory, and at the Universite' Henri Poincare'. These seminars had the purpose to provide a TUTORIAL, as opposed to a report on advanced science, addressed to a variety of people including technicians, PhD students, and senior scientists. This booklet derives from these seminars, and from numerous discussions with colleagues., Comment: 117 pages, 50 figures, 22 references

A frequency counter measures the input frequency $\bar{\nu}$ averaged over a suitable time $\tau$, versus the reference clock. High resolution is achieved by interpolating the clock signal. Further increased resolution is obtained by averaging multiple frequency measurements highly overlapped. In the presence of additive white noise or white phase noise, the square uncertainty improves from $\smash{\sigma^2_\nu\propto1/\tau^2}$ to $\smash{\sigma^2_\nu\propto1/\tau^3}$. Surprisingly, when a file of contiguous data is fed into the formula of the two-sample (Allan) variance $\smash{\sigma^2_y(\tau)=\mathbb{E}\{\frac12(\bar{y}_{k+1}-\bar{y}_k) ^2\}}$ of the fractional frequency fluctuation $y$, the result is the \emph{modified} Allan variance mod $\sigma^2_y(\tau)$. But if a sufficient number of contiguous measures are averaged in order to get a longer $\tau$ and the data are fed into the same formula, the results is the (non-modified) Allan variance. Of course interpretation mistakes are around the corner if the counter internal process is not well understood., Comment: 14 pages, 5 figures, 1 table, 18 references