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Your search keyword '"Romanyuk, K. N."' showing total 24 results
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24 results on '"Romanyuk, K. N."'

1. Orientation and structure of triple step staircase on vicinal Si(1 1 1) surfaces

Author

Teys, S. A., Romanyuk, K. N., Zhachuk, R. A., and Olshanetsky, B. Z.

Subjects
Condensed Matter - Materials Science
Abstract

The vicinal Si(111) surface, inclined towards the [-1-12] direction, was investigated by scanning tunnelling microscopy and spot profile analysing low energy electron diffraction. It has been established that the surface, consisting of regularly spaced triple steps and (111) terraces with a width equal to that of a single unit cell of the Si(111)-7x7 surface structure, has the (7 7 10) orientation. An atomic model of the triple step is proposed.

Published
2019
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9. Local electronic transport across probe/ionic conductor interface in scanning probe microscopy

Author

Romanyuk, K. N., Alikin, D. O., Slautin, B. N., Tselev, A., Shur, V. Y., Kholkin, A. L., Romanyuk, K. N., Alikin, D. O., Slautin, B. N., Tselev, A., Shur, V. Y., and Kholkin, A. L.

Abstract

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried out conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves as well as their derivatives on samples of a mixed ionic-electronic conductor Li1-xMn2O4 and developed an analytical framework for the data analysis. The implemented approach discriminates between contributions the highly resistive sample surface layer and the bulk with the account of ion redistribution in the field of the probe. It was found that, with increasing probe voltage, the conductance mechanism in the surface layer transforms from Pool-Frenkel to space-charge-limited current. The surface layer significantly alters the ion dynamics in the sample bulk under the probe, which leads, in particular, to a decrease of the effective electromechanical AFM signal associated with the ionic motion in the sample. The framework can be applied for the analysis of electronic transport mechanisms across the probe/sample interface as well as to uncover the role of the charge transport in the electric field distribution, mechanical, and other responses in AFM measurements of a broad spectrum of conducting materials. © 2020 Elsevier B.V.

Published
2021

15. Electrochemical Strain Microscopy of Li-ion battery cathodes

Author

Alikin, D. O., Romanyuk, K. N., Slautin, B. N., Rosato, D., Shur, V. Ya., Tselev, A., and Kholkin, A. L.

Abstract

The work was financially supported by the Portuguese Foundation for Science and Technology (FCT) within the project PTDC/CTM-ENE/6341/2014. The equipment of the Ural Center for Shared Use “Modern nanotechnology” UrFU was used.

Published
2019

21. Inertness and degradation of (0001) surface of Bi2Se3 topological insulator

Author

Golyashov, V. A., primary, Kokh, K. A., additional, Makarenko, S. V., additional, Romanyuk, K. N., additional, Prosvirin, I. P., additional, Kalinkin, A. V., additional, Tereshchenko, O. E., additional, Kozhukhov, A. S., additional, Sheglov, D. V., additional, Eremeev, S. V., additional, Borisova, S. D., additional, and Chulkov, E. V., additional

Published
2012
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22. Formation of Inert Bi2Se3(0001) Cleaved Surface

Author

Atuchin, V. V., primary, Golyashov, V. A., additional, Kokh, K. A., additional, Korolkov, I. V., additional, Kozhukhov, A. S., additional, Kruchinin, V. N., additional, Makarenko, S. V., additional, Pokrovsky, L. D., additional, Prosvirin, I. P., additional, Romanyuk, K. N., additional, and Tereshchenko, O. E., additional

Published
2011
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23. STM Studies of Self-Organization of Ge Nanoislands and Nanostrips before Formation Wetting Layer on Si(111) Surfaces.

Author

Teys, S. A., Romanyuk, K. N., Talochkin, A. B., and Olshanetsky, B. Z.

Subjects
*SCANNING tunneling microscopy, *SURFACE chemistry, *GERMANIUM, *SILICON, *SPECTRUM analysis, *CHEMICAL elements spectra, *MICROSCOPY equipment
Abstract

Formation of the nanoislands and nanostrips in the 350–500°C temperature range was studied by scanning tunneling microscopy before completion of the wetting layer in Ge/Si(111) system. It has been shown that the mechanism of the formation of the wetting layer depends on the rate of Ge deposition. At low deposition rates of the order of 10-3 BL/min the formation of the wetting layer proceeds by multilayer growth mechanism. Therefore the arrays of Ge islands with the densities of 109 – 1012 cm-2 appear directly on Si surface at this stage of the growth. The height of the Ge islands is limited by 3 belayers. A series of lines related to the quantization of the phonon spectrum along the growth direction was observed in the spectra of Raman scattering from the Ge nanoislands. Initial stages of the Ge growth on the vicinal surfaces Si(111) was studied. Shown differences of the Ge growth along of the steps edges when steps are perpendicular to [112] and [112] directions. Shown possibility of formation the flat nanostrips of the Ge in height 1 and 3-belayers only along steps with front to [112] direction. © 2003 American Institute of Physics [ABSTRACT FROM AUTHOR]

Published
2003
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24. Local electronic transport across probe/ionic conductor interface in scanning probe microscopy.

Author

Romanyuk KN, Alikin DO, Slautin BN, Tselev A, Shur VY, and Kholkin AL

Abstract

Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried out conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves as well as their derivatives on samples of a mixed ionic-electronic conductor Li 1-x Mn 2 O 4 and developed an analytical framework for the data analysis. The implemented approach discriminates between contributions the highly resistive sample surface layer and the bulk with the account of ion redistribution in the field of the probe. It was found that, with increasing probe voltage, the conductance mechanism in the surface layer transforms from Pool-Frenkel to space-charge-limited current. The surface layer significantly alters the ion dynamics in the sample bulk under the probe, which leads, in particular, to a decrease of the effective electromechanical AFM signal associated with the ionic motion in the sample. The framework can be applied for the analysis of electronic transport mechanisms across the probe/sample interface as well as to uncover the role of the charge transport in the electric field distribution, mechanical, and other responses in AFM measurements of a broad spectrum of conducting materials., (Copyright © 2020 Elsevier B.V. All rights reserved.)

Published
2021
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