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16. Effect of the crystal size on the X-ray diffraction patterns of isolated orthorhombic starches: A-type

Author

Rodriguez-Garcia, Mario E., Londoño-Restrepo, Sandra M., Ramirez-Gutierrez, Cristian F., and Millan-Malo, Beatriz

Subjects
Condensed Matter - Soft Condensed Matter
Abstract

The x-ray diffraction (XRD) patterns reported for starch in the literature describes it as a semicrystalline polymer that indicates that amorphous and crystalline regions form it, and this is commonly accepted. However, these patterns have not been well interpreted according to the XRD theory, and the crystal size effect has been neglected. A simulation of the effect of the crystal size on the shape and width on XRD patterns for A-type (orthorhombic structure, ICDD card No. 00-043-1858) using PDF-4 software shows that the patterns of starches are governed by the elastic and inelastic scattering producing wide peaks. For isolated starches XRD patterns, the separation of inelastic and elastic scattering is not possible, then the calculation of the crystalline percent or crystalline quality does not make any physics sense., Comment: 17 pages, 3 Figures

Published
2018

39. List of Contributors

Author

Abraham, Gustavo A., Agrawal, Satish, Ahmad, Hafsa, Ambrosio, Luigi, Arahira, Takaaki, Armyanov, Stephan, Arya, Abhishek, Atanasov, Petar A., Barbosa, Maria Ingrid Rocha, Batista, Rejane Andrade, Beitel, Susan Michelz, Benatti, Ana Carolina B., Bhushan, Binay, Bolshanina, S., Caracciolo, Pablo C., Coelho, Luciana Fontes, Contiero, Jonas, Dwivedi, Anil Kumar, Espitia, Paula J.P., Filho, Rubens Maciel, Giuliani, Alessandra, Guarino, Vincenzo, Iordache, Florin, Jardini, André Luiz, Kaasi, Andreas, Kharmandayan, Paulo, Kolev, Konstantin, Kumar, Rakesh, Londoño-Restrepo, Sandra M., Lores, Nayla J., Manescu, Adrian, Mazzoni, Serena, Nedyalkov, Nikolay N., Otoni, Caio Gomide, Pareek, Nidhi, Paritosh, Kunwar, Pattaro, Ana Flávia, Ramirez-Gutierrez, Cristian F., Rodrigues, Ana Amélia, Rodriguez-García, Mario E., Romo-Uribe, Angel, Sandri, Monica, Scaglione, Silvia, Sprio, Simone, Stankova, Nadya E., Tampieri, Anna, Todo, Mitsugu, Tromba, Giuliana, Valova, Eugenia, Villarraga-Gómez, Herminso, Vivekanand, Vivekanand, Xavier, Mariana Vitelo, Yadav, Monika, and Yanovska, A.

Published
2019
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40. EFFECT OF CERIO INSERTION ON THE STRUCTURAL, ELECTROCHEMICAL AND OPTICAL PROPERTIES OF MoO3 THIN FILMS

Author

Martínez, Héctor M., Torres, Jaime, López-Carreño, Luis D., and Rodríguez-Garcia, Mario E.

Subjects
Cíclic Voltammetry, nanoestructuras, MoO3, Voltametría Cíclica, nanostructured
Abstract

Se crecieron películas delgadas de MoO3 dopadas con Cerio empleando la técnica de atomización pirolítica utilizando una solución de (NH4)6Mo7O24.4H2O 0.1 M. El dopado se realizó adicionando CeCl3.7H2O 0.1M, en una relación de 2% en volumen. Los espectros de rayos X y de electrones Auger muestran la incorporación de Ce en la película de MoO3. Los espectros de difracción de rayos X indican que la inserción del Cerio destruye la estructura α−MoO3 observada en las películas sin dopar. Las propiedades electroquímicas se estudiaron con la técnica de voltametría cíclica entre -400 y 400 mV a velocidades de barrido desde 16 hasta 144 mV/s. Se estableció que el coeficiente de difusión varía desde 1.06 x 10(10)cm²/s, para la película sin dopar, hasta 3.49 x 10-10cm²/s para la película dopada. Las medidas de transmitancia óptica en el rango 290-2500 nm mostraron que la transmisión de la luz de la película dopada con Cerio es superior en un 10% con respecto a la película sin dopar. Cerium-doped MoO3 thin films were grown through spray pyrolysis using (NH4)6Mo7O24.4H2O 0.1 M solution. The doping was performed by adding 0.1M CeCl3.7H2O, in a ratio of 2% by volume. X-ray and Auger electron spectra show of Ce incorporation in MoO3 thin film. X-ray diffraction showed that Cerium insertion destroys the α-MoO3 structure observed in undoped films. The electrochemical properties were studied using the cyclic voltammetry technique with -400 to 400 mV and scanning speeds from 16 to 144 mV/s. It was established that the diffusion coefficient varies from 1.06 x 10-10 cm²/s for the undoped film to 3.49 x 10-10 cm²/s for doped film. This suggests that the doped film favors ion exchange processes. The optical transmittance in the range of 290-2500 nm showed that the light transmission of the film doped with Cerium is higher by 10% compared to the undoped film.

Published
2014

41. EFECTO DE LA INSERCIÓN DE CERIO EN LAS PROPIEDADES ESTRUCTURALES, ELECTROQUÍMICAS Y ÓPTICAS DE PELÍCULAS DELGADAS MoO3.

Author

Martínez, Héctor M., Torres, Jaime, López-Carreño, Luis D., and Rodríguez-Garcia, Mario E.

Subjects
MOLYBDENUM oxides, THIN film research, PYROLYSIS, CERIUM, NANOSTRUCTURED materials
Abstract

Copyright of La Revista Latinoamericana de Metalurgia y Materiales, RLMM is the property of Universidad Simon Bolivar, Departmento de Ciencia de los Materiales and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Published
2014

42. EFECTO DE LA INSERCIÓN DE CERIO EN LAS PROPIEDADES ESTRUCTURALES, ELECTROQUÍMICAS Y ÓPTICAS DE PELÍCULAS DELGADAS MoO3.

Author

Martínez, Héctor M., Torres, Jaime, López-Carreño, Luis D., and Rodríguez-Garcia, Mario E.

Subjects
*MOLYBDENUM oxides, *THIN film research, *PYROLYSIS, *CERIUM, *NANOSTRUCTURED materials
Abstract

Cerium-doped MoO3 thin films were grown through spray pyrolysis using (NH4) 6Mo7O 24 4H2O 0.1 M solution. The doping was performed by adding 0.1M CeCl3.7H2O, in a ratio of 2% by volume. X-ray and Auger electron spectra show of Ce incorporation in MoO3 thin film. X-ray diffraction showed that Cerium insertion destroys the α-MoO3 structure observed in undoped films. The electrochemical properties were studied using the cyclic voltammetry technique with -400 to 400 mV and scanning speeds from 16 to 144 mV/s. It was established that the diffusion coefficient varies from 1.06 x 10-10 cm²/s for the undoped film to 3.49 x 10 cm²/s for doped film. This suggests that the doped film favors ion exchange processes. The optical transmittance in the range of 290-2500 nm showed that the light transmission of the film doped with Cerium is higher by 10% compared to the undoped film. [ABSTRACT FROM AUTHOR]

Published
2014

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