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The electrical properties and performance characteristics of niobium dioxide (NbO$_\mathrm{2}$)-based memristive devices are examined at cryogenic temperatures. Sub-stoichiometric Nb$_\mathrm{2}$O$_\mathrm{5}$ was deposited via magnetron sputtering and patterned in microscale (2$\times$2 - 15$\times$15 $\mu$m$^2$) cross-bar Au/Ru/NbO$_\mathrm{x}$/Pt devices and electroformed at 3-5 V to make NbO$_\mathrm{2}$ filaments. At cryogenic temperatures, the threshold voltage ($V_\mathrm{th}$) increased by more than a factor of 3. The hold voltage ($V_\mathrm{h}$) was significantly lower than the threshold voltage for fast voltage sweeps (200 ms per measurement). If the sample is allowed to cool between voltage measurements, the hold voltage increases, but never reaches the threshold voltage, indicating the presence of non-volatile Nb$_\mathrm{2}$O$_\mathrm{5}$ in the filament. The devices have an activation energy of $E_a \approx 1.4$ eV, lower than other NbO$_\mathrm{2}$ devices reported. Our works shows that even nominally ``bad" memristive devices can be improved by reducing the leakage current and increases the sample resistance at cryogenic temperatures., Comment: 16 pages, 5 figures

Significant research has focused on low-power stochastic devices built from memristive materials. These devices foster neuromorphic approaches to computational efficiency enhancement in merged biomimetic and CMOS architectures due to their ability to phase transition from a dielectric to a metal at an increased temperature. Niobium dioxide has a volatile memristive phase change that occurs $\sim$800$^\circ$C~that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for \emph{in situ} spectral measurements as an as-grown \NbtOf\ film is annealed and ultimately crystallizes as \NbOt. The system measures the changing spectral transmissivity of \NbtOf\ as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic \NbOt\ during the cooldown phase, which is shown to occur about 100$^\circ$C~ lower on a sapphire substrate than fused silica. After annealing, the material properties of the \NbtOf\ and \NbOt\ were assessed via X-ray photoelectron spectroscopy, X-ray diffraction, and 4-point resistivity, confirming that we have made crystalline \NbOt.

Amorphous vanadium dioxide (VO$_{2}$) films deposited by atomic layer deposition (ALD) were crystallized with an ex situ anneal at 660-670 ${\deg}$C for 1-2 hours under a low oxygen pressure (10$^{-4}$ to 10$^{-5}$ Torr). Under these conditions the crystalline VO$_{2}$ phase was maintained, while formation of the V$_{2}$O$_{5}$ phase was suppressed. Electrical transition from the insulator to the metallic phase was observed in the 37-60 ${\deg}$C range, with a R$_{ON}$/R$_{OFF}$ ratio of up to about 750 and critical transition temperature of 7-10 ${\deg}$C. Electric field applied across two-terminal device structures induced a reversible phase change, with a room temperature transition field of about 25 kV/cm in the VO$_{2}$ sample processed with the 2 hr long anneal. Both the width and slope of the field induced MIT hysteresis were dependent upon the VO$_{2}$ crystalline quality., Comment: 15 pages, 5 figures, 1 table

Understanding the influence that copper substrate surface symmetry and oxygen impurities have on the growth of graphene by chemical vapor deposition is important for developing techniques for producing high quality graphene. Therefore, we have studied the growth of graphene by catalytic decomposition of ethylene in an ultra-high vacuum chamber on both a clean Cu(100) surface and a Cu(100) surface pre-dosed with a layer of chemisorbed oxygen. The crystal structure of the graphene films was characterized with \emph{in-situ} low energy electron diffraction. By heating the clean Cu(100) substrate from room temperature to the growth temperature in ethylene, epitaxial graphene films were formed. The crystal quality was found to depend strongly on the growth temperature. At 900 $^\circ$C, well-ordered two-domain graphene films were formed. Pre-dosing the Cu(100) surface with a chemisorbed layer of oxygen before graphene growth was found to adversely affect the crystal quality of the graphene overlayer by inducing a much higher degree of rotational disorder of the graphene grains with respect to the Cu(100) substrate. The growth morphology of the graphene islands during the initial stages of nucleation was monitored with \emph{ex-situ} scanning electron microscopy. The nucleation rate of the graphene islands was observed to drop by an order of magnitude by pre-dosing the Cu(100) surface with a chemisorbed oxygen layer before growth. This reduction in nucleation rate results in the formation of much larger graphene islands. Therefore, the presence of oxygen during graphene growth affects both the relative orientation and average size of grains within the films grown on Cu(100) substrates.

The growth of graphene by catalytic decomposition of ethylene on Cu(111) in an ultra-high vacuum system was investigated with low energy electron diffraction, low energy electron microscopy, and atomic force microscopy. Attempts to form a graphene overlayer using ethylene at pressures as high as 10 mTorr and substrate temperatures as high as 900 $^\circ$C resulted in almost no graphene growth. By using an argon overpressure, the growth of epitaxial graphene on Cu(111) was achieved. The suppression of graphene growth without the use of an argon overpressure is attributed to Cu sublimation at elevated temperatures. During the initial stages of growth, a random distribution of rounded graphene islands is observed. The predominant rotational orientation of the islands is within $\pm1^\circ$ of the Cu(111) substrate lattice.