162 results on '"Richard, M.-I."'
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2. Structural evolution of nanoparticles under realistic conditions observed with Bragg coherent X-ray imaging
3. Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals
4. Coupling of coherent misfit strain and composition distributions in core–shell Ge/Ge1-xSnx nanowire light emitters
5. Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(0 0 1) substrates
6. In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization
7. Identification of M-CSF independent mechanisms of human osteoclast formation and analysis of the cellular and molecular mechanisms involved in tumour osteolysis
8. Temperature dependency of the strain distribution induced by TSVs in silicon: A comparative study between micro-Laue and monochromatic nano-diffraction
9. Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction
10. Bragg coherent diffraction imaging of single 20 nm Pt particles at the ID01-EBS beamline of ESRF
11. Exploring Pd–Si(001) and Pd–Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements
12. Strain inhomogeneity in copper islands probed by coherent X-ray diffraction
13. In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(0 0 1) and Si (1 1 1)
14. Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands
15. Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures: MAD and DAFS for studying Semiconductor Nanostructures
16. Coalescence of domes and superdomes at a low growth rate or during annealing: Towards the formation of flat-top superdomes
17. X-Ray Probes for In Situ Studies of Interfaces
18. Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
19. In situ x-ray studies of the incipient ZnO atomic layer deposition on In 0.53 Ga 0.47 As
20. In situ investigation by GISAXS and GIXD of the growth mode, strain state and shape of Ge islands during their growth on Si(0 0 1)
21. Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study
22. Multi-wavelength Bragg coherent X-ray diffraction imaging of Au particles
23. Temperature evolution of defects and atomic ordering in Si1-xGex islands on Si(001).
24. Study of the microstructure and stress induced during the crystallization of GeTe thin films
25. Strain Distribution Induced in SOI Photonic Substrate by Through Silicon via Using Advanced Scanning X-Ray Nano-Diffraction
26. Study of Amorphous - Crystalline Phase Transition in Phase Change Materials
27. In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction
28. Amorphous - Crystalline Phase Transition in Phase Change Materials
29. In-situ combined X-Ray diffraction and optical curvature measurements to study microstructure and stress induced during the crystallization of GeTe thin films
30. In situ X-ray studies during the early stage of ZnO Atomic Layer Deposition on InGaAs
31. Intermixing in single Ge-Si core-shell nanowires: a coherent X-ray imaging study
32. Strain and Lattice Orientation Distribution in SiN/Ge CMOS Compatible Light Emitting Microstructures by Quick X-ray Nano-diffraction Microscopy
33. In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire
34. 3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented Nanocrystal
35. Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditions
36. Study of Crystalline - Amorphous Phase Transition in Phase Change Materials
37. An Atomistic View of the Incipient Growth of Zinc Oxide by in-situ Xray Absorption Spectroscopy'
38. An atomistic view of the incipient growth of zinc oxide by in-situ x-ray absorption spectroscopy, Workshop on synchrotron radiation to study atomic layer deposition
39. New strategies for producing strain engineered SiGe nanomembranes
40. In-situ synchrotron analysis of the very first ALD growth steps of ZnO on a-SiO2 and c-plane Al2O3
41. Coherent nanoscale X-ray probe for crystal interrogation at ID01, ESRF – The European Synchrotron
42. Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements
43. Silicide formation during reaction between Ni ultra-thin films and Si(0 0 1) substrates
44. Temperature evolution of defects and atomic ordering in Si1−xGex islands on Si(001)
45. Evolution of Crystal Structure During the Initial Stages of ZnO Atomic Layer Deposition
46. Continuous and Collective Grain Rotation in Nanoscale Thin Films during Silicidation
47. Effect of the temperature on the strain distribution induced in silicon interposer by TSVs: A comparison between micro-Laue and monochromatic nanodiffraction
48. Direct evidence of strain transfer for InAs island growth on compliant Si substrates
49. Through-silicon via-induced strain distribution in silicon interposer
50. Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
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