16 results on '"Rakkhit R"'
Search Results
2. Characterization and optimization of metal etch processes to minimize charging damage to submicron transistor gate oxide
3. Process induced oxide damage and its implications to device reliability of submicron transistors.
4. A comparison of inverter-type circuit lifetime and quasi-static analysis of NMOSFET lifetime.
5. Drain-avalanche induced hole injection and generation of interface traps in thin oxide MOS devices.
6. An investigation of the time dependence of current degradation in MOS devices.
7. High risk of recurrence for patients with breast cancer who have human epidermal growth factor receptor 2-positive, node-negative tumors 1 cm or smaller.
8. Impact of boron penetration at the p/sup +/-poly/gate-oxide interface on the device reliability of deep submicron CMOS logic technology.
9. Slight gate oxide thickness increase in PMOS devices with BF2 implanted polysilicon gate.
10. A comprehensive study of performance and reliability of P, As, and hybrid As/P nLDD junctions for deep-submicron CMOS logic technology.
11. An Investigation of the Time Dependence of Current Degradation In MOS Devices
12. Drain-avalanche induced hole injection and generation of interface traps in thin oxide MOS devices
13. A new technique to measure thin oxide thickness in IC manufacturing
14. BCR-JAK2 fusion as a result of a translocation (9;22)(p24;q11.2) in a patient with CML-like myeloproliferative disease
15. A new technique to measure thin oxide thickness in IC manufacturing.
16. An investigation of hot carrier effects in submicron CMOS integrated circuits
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.