1. Comparison of Gain Degradation and Deep Level Transient Spectroscopy in pnp Si Bipolar Junction Transistors Irradiated With Different Ion Species
- Author
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G. Vizkelethy, R. M. Fleming, Edward S. Bielejec, William Joseph Martin, Brandon Adrian Aguirre, Donald B. King, B. L. Vaandrager, and J. M. Campbell
- Subjects
010302 applied physics ,Nuclear and High Energy Physics ,Materials science ,Deep-level transient spectroscopy ,Silicon ,010308 nuclear & particles physics ,Annealing (metallurgy) ,Analytical chemistry ,chemistry.chemical_element ,01 natural sciences ,Spectral line ,Ion ,Nuclear Energy and Engineering ,chemistry ,Physics::Plasma Physics ,Ionization ,0103 physical sciences ,Neutron ,Irradiation ,Electrical and Electronic Engineering ,Atomic physics - Abstract
We studied the effect of light ion and heavy ion irradiations on pnp Si BJTs. A mismatch in DLTS deep peak amplitude for devices with same final gain but irradiated with different ion species was observed. Also, different ions cause different gain degradation when the DLTS spectra are matched. Pre-dosed ion-irradiated samples show that ion induced ionization does not account for the differences in DLTS peak height but isochronal annealing studies suggest that light ions produce more VP defects than heavy ions to compensate for the lack of clusters that heavy ions produce. The creation of defect clusters by heavy ions is evident by the higher content of E4 and ${\mathrm {V}}_{2}^{\ast}$ defects compared to light ions.
- Published
- 2017
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