Search

We investigate the interaction between two magnetic layers separated with a normal metal insertion layer (Ti, Pt, and Ru) using x-ray ferromagnetic resonance (XFMR). We measure the amplitude and phase of the ferromagnetic resonance of both layers. Our results indicate that a ferromagnetic exchange coupling between two layers is a dominant coupling mechanism for a thick insertion metal layer. Based on the exchange coupling model, we extract the smallest value of the indirect exchange coefficient of 1.2 μJ/m2, which corresponds to an exchange field of about 0.36 mT. While this value is difficult to measure with other experimental tools, we were able to measure the small value because XFMR detects a resonance phenomenon of a thin layer generated by an oscillating indirect exchange and the Oersted fields with a phase and layer resolved observation.

Insulating antiferromagnets have recently emerged as efficient and robust conductors of spin current. Element-specific and phase-resolved x-ray ferromagnetic resonance has been used to probe the injection and transmission of ac spin current through thin epitaxial NiO(001) layers. The spin current is found to be mediated by coherent evanescent spin waves of GHz frequency, rather than propagating magnons of THz frequency, paving the way towards coherent control of the phase and amplitude of spin currents within an antiferromagnetic insulator at room temperature.