6 results on '"Privat, Aymeric"'
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2. TCAD Calibrated SEE Fault Model Validated with Beam Results for a 12nm D Flip-Flop.
3. Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS Technology
4. Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose
5. Physically Based Predictive Model for Single Event Transients in CMOS Gates
6. Simple and accurate single event charge collection macro modeling for circuit simulation
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