262 results on '"Pey, Kin-Leong"'
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2. Probing resistive switching in HfO2/Al2O3 bilayer oxides using in-situ transmission electron microscopy
3. Dielectric breakdown of 2D muscovite mica
4. Random Telegraph Noise Nano-spectroscopy in High-κ Dielectrics Using Scanning Probe Microscopy Techniques
5. Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators
6. Pyramidal structural defects in erbium silicide thin films
7. Percolation Framework and Monte Carlo Techniques for Improved Probabilistic Design of Variability in Products and Systems
8. Electrical Stress Induced Breakdown and Post Breakdown Physical Analysis of Mica Based Nano Capacitors
9. Reliability Analysis of Random Telegraph Noisebased True Random Number Generators
10. Resistive switching characteristics of MIM structures based on oxygen-variable ultra-thin HfO2 and fabricated at low temperature
11. Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces
12. Thermal simulations of lock-in-thermography for failure analysis of integrated circuits
13. Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices
14. A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices
15. Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory
16. Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach
17. Molecular Bridges Link Monolayers of Hexagonal Boron Nitride during Dielectric Breakdown
18. Impact of Voltage Polarity on Time-Dependent Dielectric Breakdown of 1-nm MgO-Based STT-MRAM With Self-Heating Correction
19. Experimental and Theoretical Investigation of Intracell Magnetic Coupling-Induced Variability of Spin-Transfer Torque Magnetic RAMs
20. Statistical Modeling of Degradation Behavior in Split-Gate Non-Volatile Memory Devices
21. Germanium coated vertically-aligned multiwall carbon nanotubes as lithium-ion battery anodes
22. Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices
23. Robust Electromigration reliability through engineering optimization
24. Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory
25. Assessment of read disturb immunity in conducting bridge memory devices – A thermodynamic perspective
26. Stable cyclic performance of nickel oxide–carbon composite anode for lithium-ion batteries
27. High-κ dielectric breakdown in nanoscale logic devices – Scientific insight and technology impact
28. Characterization of Grain Boundaries in Polycrystalline HfO2 Dielectrics
29. Electro-Optical Interactions in FinFETs
30. Study of preferential localized degradation and breakdown of HfO2/SiOx dielectric stacks at grain boundary sites of polycrystalline HfO2 dielectrics
31. Percolation Framework and Monte Carlo Techniques for Improved Probabilistic Design of Variability in Products and Systems
32. Experimental characterization and modeling of the mechanical properties of Cu–Cu thermocompression bonds for three-dimensional integrated circuits
33. Game-Based versus Gamified Learning Platform in Helping University Students Learn Programming
34. Spatially Controlled Generation and Probing of Random Telegraph Noise in Metal Nanocrystal Embedded HfO2 Using Defect Nanospectroscopy
35. Evidence for compliance controlled oxygen vacancy and metal filament based resistive switching mechanisms in RRAM
36. Physical analysis of breakdown in high-κ/metal gate stacks using TEM/EELS and STM for reliability enhancement (invited)
37. Silicon-Controlled Rectifier Embedded Diode for 7 nm FinFET Process Electrostatic Discharge Protection
38. Decoupling the sequence of dielectric breakdown in single device bilayer stacks by radiation-controlled, spatially localized creation of oxide defects
39. Standards for the Characterization of Endurance in Resistive Switching Devices
40. Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride
41. Short Wavelength Probing for Fault Isolation Applications
42. Laser thermal processing of amorphous silicon gates to reduce poly-depletion in CMOS devices
43. Spatially Controlled Generation and Probing of Random Telegraph Noise in Metal Nanocrystal Embedded HfO2 Using Defect Nanospectroscopy.
44. Analysis and Simulation of Interface Quality and Defect Induced Variability in MgO Spin-Transfer Torque Magnetic RAMs
45. Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride
46. Effects of Nanometer-Scale Surface Roughness and Applied Load on the Bond Strength and Contact Resistance of Cu-Cu Bonded 3D ICs
47. Effectiveness of Physical Robot Versus Robot Simulator in Teaching Introductory Programming
48. Enhanced Boron Activation in Strained-Si/Si1-xGex Substrate Using Laser Annealing
49. Full Range Work Function Tuning of MOSFETs using Interfacial Yttrium Layer in fully Germanided Ni Gate
50. Impact of Gate Dielectric Breakdown Induced Microstructural Defects on Transistor Reliability
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